THz metrology

Frequenz

Volumn 62, Issue 5-6, 2008, Pages 137-148

  Kleine Ostmann, T ^a   Schrader, T ^a   Bieler, M ^a   Siegner, U ^a   Monte, C ^a   Gutschwager, B ^a   Hollandt, J ^a   Steiger, A ^a   Werner, L ^a   Muller R ^a   Ulm, G ^a   Pupeza, I ^b   Koch, M ^b  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

Calibration; Sub mm waves; Terahertz metrology; THz time domain spectroscopy; Traceability

Indexed keywords

CALIBRATION; MILLIMETER WAVES; SPECTROSCOPY; SUBMILLIMETER WAVES; TERAHERTZ SPECTROSCOPY; UNITS OF MEASUREMENT;

COMMERCIAL APPLICATIONS; DETECTION SCHEME; FUNDAMENTAL RESEARCH; MATERIAL PARAMETER; NATIONAL METROLOGY INSTITUTES; TERAHERTZ METROLOGY; THZ TIME DOMAIN SPECTROSCOPY; TRACEABILITY;

TERAHERTZ WAVES;

EID: 49649108331     PISSN: 00161136     EISSN: None     Source Type: Journal    
DOI: 10.1515/FREQ.2008.62.5-6.137     Document Type: Article

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