Characterization of an external electro-optic sampling probe: Influence of probe height on distortion of measured voltage pulses

Journal of Applied Physics

Volumn 100, Issue 11, 2006, Pages

  Seitz, S ^a   Bieler, M ^a   Hein, G ^a   Pierz, K ^a   Siegner, U ^a   Schmuckle F J ^b   Heinrich, W ^b  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ELECTROOPTICAL DEVICES; FINITE DIFFERENCE METHOD; NUMERICAL ANALYSIS; SENSITIVITY ANALYSIS;

FINITE DIFFERENCE CALCULATIONS; VOLTAGE PULSES;

PROBES;

EID: 33845796670     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2396798     Document Type: Article

References (24)

1. M. Y. Frankel, S. Gupta, J. A. Valdmanis, and G. A. Mourou, IEEE Trans. Microwave Theory Tech. 0018-9480 10.1109/22.81658 39, 910 (1991).
2. T. S. Clement, D. F. Williams, P. D. Hale, and J. M. Morgan, 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society Digest (IEEE, New York, 2002).
3. T. F. Carruthers, M. Y. Frankel, and C. S. Kyono, Appl. Phys. Lett. 0003-6951 10.1063/1.110649 63, 1921 (1993).
4. M. Bieler, M. Spitzer, G. Hein, U. Siegner, F. Schneider, T. Tischler, and W. Heinrich, Meas. Sci. Technol. 0957-0233 10.1088/0957-0233/15/9/004 15, 1694 (2004).
5. J. A. Valdmanis and G. A. Mourou, IEEE J. Quantum Electron. 0018-9197 10.1109/JQE.1986.1072867 22, 69 (1986).
6. H. -M. Heiliger, M. Nagel, H. G. Roskos, H. Kurz, F. Schnieder, W. Heinrich, R. Hey, and K. Ploog, Appl. Phys. Lett. 0003-6951 10.1063/1.118849 70, 2233 (1997).
7. J. A. Valdmanis, Measurement of High Speed Signals in Solid State Device (Academic, New York, 1990), Vol. 28.
8. X. Wu, D. Conn, J. Song, and K. Nickerson, J. Lightwave Technol. 0733-8724 10.1109/50.219579 11, 448 (1993).
9. M. Rottenkolber, W. Thomann, and P. Russer, IEEE MTT-S Int. Microwave Symp. Dig. 1, 265 (1993).
10. T. Nagatsuma, T. Shibata, E. Sano, and A. Iwata, J. Appl. Phys. 0021-8979 10.1063/1.344008 66, 4001 (1989).
11. A. Zeng, S. A. Shah, and M. K. Jackson, IEEE Trans. Microwave Theory Tech. 0018-9480 10.1109/22.508652 44, 1155 (1996).
12. O. Hollricher, F. Rüders, and C. Buchal, J. Appl. Phys. 0021-8979 77, 1093 (1995).
13. M. Y. Frankel, J. F. Whitaker, G. A. Mourou, and J. A. Valdmanis, IEEE Microw. Guid. Wave Lett. 1051-8207 10.1109/75.80723 1, 60 (1991).
14. F. W. Smith, H. Q. Le, V. Diadiuk, M. A. Hollis, A. R. Calawa, S. Gupta, M. Frankel, D. R. Dykaar, G. A. Mourou, and T. Y. Hsiang, Appl. Phys. Lett. 0003-6951 10.1063/1.100800 54, 890 (1989).
15. J. F. Whitaker, Mater. Sci. Eng., B 0921-5107 10.1016/0921-5107(93)90224- B 22, 61 (1993).
16. M. B. Ketchen, D. Grischkowsky, T. C. Chen, C. -C. Chi, N. Duling, N. J. Halas, J. -M. Halbout, J. A. Kash, and G. P. Li, Appl. Phys. Lett. 0003-6951 10.1063/1.96709 48, 751 (1986).
17. J. A. Valdmanis, G. A. Mourou, and C. W. Gabel, Appl. Phys. Lett. 0003-6951 10.1063/1.93485 41, 211 (1982).
18. B. H. Kolner and B. M. Bloom, IEEE J. Quantum Electron. 0018-9197 10.1109/JQE.1986.1072877 22, 79 (1986).
19. S. Kane Yee, IEEE Trans. Antennas Propag. 0018-926X 10.1109/TAP.1966. 1138693 14, 302 (1966).
20. K. Beilenhoff, W. Heinrich, and H. L. Hartnagel, IEEE Trans. Microwave Theory Tech. 0018-9480 40, 540 (1992).
21. A. Yariv, Optical Electronics in Modern Communications (Oxford University Press, New York, 1997).
22. S. E. Ralph, Y. Chen, J. Woodall, and D. McInturff, Phys. Rev. B 0163-1829 10.1103/PhysRevB.54.5568 54, 5568 (1996).
23. Note that the FDFD calculation does not give deeper insight into the pulse shape since its bandwidth is limited to 300 GHz. This bandwidth limitation has only a minor effect on the calculation of pulse maxima, but precludes the analysis of pulse shapes.
24. A. J. A. Smith, A. G. Roddie, and D. Henderson, Opt. Quantum Electron. 0306-8919 10.1007/BF00820158 28, 933 (1996).