Accurate determination of the spectral responsivity of silicon trap detectors between 238 nm and 1015 nm using a laser-based cryogenic radiometer

Metrologia

Volumn 37, Issue 4, 2000, Pages 279-284

  Werner, L ^a   Fischer, J ^a   Johannsen, U ^a   Hartmann, J ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENIC EQUIPMENT; INFRARED RADIATION; INTERPOLATION; LASER BEAM EFFECTS; MATHEMATICAL MODELS; PHOTODIODES; RING LASERS; SILICON SENSORS; TEMPERATURE MEASUREMENT; ULTRAVIOLET RADIATION;

INTRA-CAVITY FREQUENCY DOUBLING; SILICON TRAP DETECTORS; SPECTRAL RESPONSIVITY;

RADIOMETERS;

EID: 0034503782     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/37/4/3     Document Type: Article

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