-
2
-
-
0038614690
-
50 years of RF and microwave sampling
-
Jun.
-
M. Kahrs, "50 years of RF and microwave sampling," IEEE Trans. Microw. Theory Tech., vol. 51, no. 6, pp. 1787-1805, Jun. 2003.
-
(2003)
IEEE Trans. Microw. Theory Tech.
, vol.51
, Issue.6
, pp. 1787-1805
-
-
Kahrs, M.1
-
3
-
-
84954134986
-
Estimating magnitude and phase response of a 50 GHz sampling oscilloscope using the 'nose-to-nose' method
-
Jun.
-
P. D. Hale, T. S. Clement, K. J. Coakley, C. M. Wang, D. C. DeG-root, and A. P. Verdoni, "Estimating magnitude and phase response of a 50 GHz sampling oscilloscope using the 'nose-to-nose' method," in ARFTG Conf. Dig., Jun. 2000, vol. 55, pp. 335-342.
-
(2000)
ARFTG Conf. Dig.
, vol.55
, pp. 335-342
-
-
Hale, P.D.1
Clement, T.S.2
Coakley, K.J.3
Wang, C.M.4
DeGroot, D.C.5
Verdoni, A.P.6
-
4
-
-
84954189067
-
Analysis of interconnection networks and mismatch in the nose-to-nose calibration
-
Jun.
-
D. C. DeGroot, P. D. Hale, M. V. Bossche, F. Verbeyst, and J. Verspecht, "Analysis of interconnection networks and mismatch in the nose-to-nose calibration," in ARFTG Conf. Dig., Jun. 2000, vol. 55, pp. 116-121.
-
(2000)
ARFTG Conf. Dig.
, vol.55
, pp. 116-121
-
-
DeGroot, D.C.1
Hale, P.D.2
Bossche, M.V.3
Verbeyst, F.4
Verspecht, J.5
-
5
-
-
0028422178
-
Individual characterization of broadband sampling oscilloscopes with a nose-to-nose calibration procedure
-
Apr.
-
J. Verspecht and K. Rush, "Individual characterization of broadband sampling oscilloscopes with a nose-to-nose calibration procedure," IEEE Trans. Instrum. Meas., vol. 43, no. 2, pp. 347-354, Apr. 1994.
-
(1994)
IEEE Trans. Instrum. Meas.
, vol.43
, Issue.2
, pp. 347-354
-
-
Verspecht, J.1
Rush, K.2
-
6
-
-
0025492158
-
Characterizing high-speed oscilloscopes
-
Sep.
-
K. Rush, S. Draving, and J. Kerley, "Characterizing high-speed oscilloscopes," IEEE Spectr., vol. 27, no. 9, pp. 38-39, Sep. 1990.
-
(1990)
IEEE Spectr.
, vol.27
, Issue.9
, pp. 38-39
-
-
Rush, K.1
Draving, S.2
Kerley, J.3
-
7
-
-
0029484916
-
Broadband sampling oscilloscope characterization with the 'nose-to-nose' calibration procedure: A theoretical and practical analysis
-
Dec.
-
J. Verspecht, "Broadband sampling oscilloscope characterization with the 'nose-to-nose' calibration procedure: A theoretical and practical analysis," IEEE Trans. Instrum. Meas, vol. 44, no. 6, pp. 991-997, Dec. 1995.
-
(1995)
IEEE Trans. Instrum. Meas
, vol.44
, Issue.6
, pp. 991-997
-
-
Verspecht, J.1
-
8
-
-
0035483243
-
An examination of the spectra of the 'kick-out' pulses for a proposed sampling oscilloscope calibration method
-
Oct.
-
N. G. Paulter and D. R. Larson, "An examination of the spectra of the 'kick-out' pulses for a proposed sampling oscilloscope calibration method," IEEE Trans. Instrum. Meas, vol. 50, no. 5, pp. 1221-1223, Oct. 2001.
-
(2001)
IEEE Trans. Instrum. Meas
, vol.50
, Issue.5
, pp. 1221-1223
-
-
Paulter, N.G.1
Larson, D.R.2
-
9
-
-
31344467629
-
The impact of internal sampling circuitry on the phase error of the nose-to-nose oscilloscope calibration
-
NIST, Boulder, CO, Aug.
-
K. A. Remley, "The impact of internal sampling circuitry on the phase error of the nose-to-nose oscilloscope calibration," NIST, Boulder, CO, Tech. Note 1528, Aug. 2003.
-
(2003)
Tech. Note
, vol.1528
-
-
Remley, K.A.1
-
10
-
-
33747287339
-
Nose-to-nose oscilloscope calibration phase error inherent in the sampling circuitry
-
Dec.
-
_, "Nose-to-nose oscilloscope calibration phase error inherent in the sampling circuitry," in ARFTG Conf. Dig., Dec. 2002, vol. 60, pp. 85-97.
-
(2002)
ARFTG Conf. Dig.
, vol.60
, pp. 85-97
-
-
-
11
-
-
0025545231
-
Dynamic calibration of waveform recorders and oscilloscopes using pulse standards
-
Dec.
-
W. L. Gans, "Dynamic calibration of waveform recorders and oscilloscopes using pulse standards," IEEE Trans. Instrum. Meas, vol. 39, no. 6, pp. 952-957, Dec. 1990.
-
(1990)
IEEE Trans. Instrum. Meas
, vol.39
, Issue.6
, pp. 952-957
-
-
Gans, W.L.1
-
12
-
-
0032180184
-
Fast pulse oscilloscope calibration system
-
Oct.
-
J. P. Deyst, N. G. Paulter, T. M. Souders, G. N. Stenbakken, and T. A. Daboczi, "Fast pulse oscilloscope calibration system," IEEE Trans. Instrum. Meas., vol. 47, no. 5, pp. 1037-1041, Oct. 1998.
-
(1998)
IEEE Trans. Instrum. Meas.
, vol.47
, Issue.5
, pp. 1037-1041
-
-
Deyst, J.P.1
Paulter, N.G.2
Souders, T.M.3
Stenbakken, G.N.4
Daboczi, T.A.5
-
13
-
-
0025470259
-
Calibration of fast sampling oscilloscopes
-
D. Henderson and A. G. Roddie, "Calibration of fast sampling oscilloscopes," Meas. Sci. Technol., no. 1, pp. 673-679, 1990.
-
(1990)
Meas. Sci. Technol.
, Issue.1
, pp. 673-679
-
-
Henderson, D.1
Roddie, A.G.2
-
14
-
-
0036069707
-
Optoelectronic techniques for improved high speed electrical risetime
-
Jun.
-
A. J. A. Smith, A. G. Roddie, and P. D. Woolliams, "Optoelectronic techniques for improved high speed electrical risetime," in IEEE MTT-S Int. Microw. Symp. Dig., Jun. 2002, vol. 3, pp. 1501-1504.
-
(2002)
IEEE MTT-S Int. Microw. Symp. Dig.
, vol.3
, pp. 1501-1504
-
-
Smith, A.J.A.1
Roddie, A.G.2
Woolliams, P.D.3
-
15
-
-
0026925697
-
Recent developments in the calibration of fast sampling oscilloscopes
-
Sep.
-
D. Henderson, A. G. Roddie, and A. J. A. Smith, "Recent developments in the calibration of fast sampling oscilloscopes," Proc. Inst. Elect. Eng. - Sci., Meas. Technol., vol. 139, no. 5, pp. 254-260, Sep. 1992.
-
(1992)
Proc. Inst. Elect. Eng. - Sci., Meas. Technol.
, vol.139
, Issue.5
, pp. 254-260
-
-
Henderson, D.1
Roddie, A.G.2
Smith, A.J.A.3
-
16
-
-
25644447574
-
Optoelectonic measurement of the transfer function and time response of a 70 GHz sampling oscilloscope
-
Oct.
-
S. Seitz, M. Bieler, M. Spitzer, K. Pierz, G. Hein, and U. Siegner, "Optoelectonic measurement of the transfer function and time response of a 70 GHz sampling oscilloscope," Meas. Sci. Tech., vol. 16, no. 10, pp. L7-L9, Oct. 2005.
-
(2005)
Meas. Sci. Tech.
, vol.16
, Issue.10
-
-
Seitz, S.1
Bieler, M.2
Spitzer, M.3
Pierz, K.4
Hein, G.5
Siegner, U.6
-
17
-
-
0035686249
-
Calibrating electro-optic sampling systems
-
May
-
D. F. Williams, P. D. Hale, T. S. Clement, and J. M. Morgan, "Calibrating electro-optic sampling systems," in IEEE MTT-S Int. Microw. Symp. Dig., May 2001, vol. 3, pp. 1527-1530.
-
(2001)
IEEE MTT-S Int. Microw. Symp. Dig.
, vol.3
, pp. 1527-1530
-
-
Williams, D.F.1
Hale, P.D.2
Clement, T.S.3
Morgan, J.M.4
-
18
-
-
27644542973
-
Uncertainty of the NIST electrooptic sampling system
-
NIST, Boulder, CO, Dec.
-
D. F. Williams, P. D. Hale, T. S. Clement, and C. M. Wang, "Uncertainty of the NIST electrooptic sampling system," NIST, Boulder, CO, Tech. Note 1535, Dec. 2004.
-
(2004)
Tech. Note
, vol.1535
-
-
Williams, D.F.1
Hale, P.D.2
Clement, T.S.3
Wang, C.M.4
-
19
-
-
84960429637
-
Mismatch corrections for electro-optic sampling systems
-
Nov.
-
D. F. Williams, P. D. Hale, T. S. Clement, and J. M. Morgan, "Mismatch corrections for electro-optic sampling systems," in ARFTG Conf. Dig., Nov. 2000, vol. 56, pp. 141-145.
-
(2000)
ARFTG Conf. Dig.
, vol.56
, pp. 141-145
-
-
Williams, D.F.1
Hale, P.D.2
Clement, T.S.3
Morgan, J.M.4
-
20
-
-
0033325346
-
Least-squares estimation of time-base distortion of sampling oscilloscopes
-
Dec.
-
C. M. Wang, P. D. Hale, and K. J. Coakley, "Least-squares estimation of time-base distortion of sampling oscilloscopes," IEEE Trans. Instrum. Meas, vol. 48, no. 6, pp. 1324-1332, Dec. 1999.
-
(1999)
IEEE Trans. Instrum. Meas
, vol.48
, Issue.6
, pp. 1324-1332
-
-
Wang, C.M.1
Hale, P.D.2
Coakley, K.J.3
-
21
-
-
0036476744
-
Uncertainty of oscilloscope timebase distortion estimate
-
Feb.
-
C. M. Wang, P. D. Hale, K. J. Coakley, and T. S. Clement, "Uncertainty of oscilloscope timebase distortion estimate," IEEE Trans. Instrum. Meas, vol. 51, no. 1, pp. 53-58, Feb. 2002.
-
(2002)
IEEE Trans. Instrum. Meas
, vol.51
, Issue.1
, pp. 53-58
-
-
Wang, C.M.1
Hale, P.D.2
Coakley, K.J.3
Clement, T.S.4
-
22
-
-
0035248971
-
Alignment of noisy signals
-
Feb.
-
K. J. Coakley and P. D. Hale, "Alignment of noisy signals," IEEE Trans. Instrum. Meas. vol. 50, no. 1, pp. 141-149, Feb. 2001.
-
(2001)
IEEE Trans. Instrum. Meas.
, vol.50
, Issue.1
, pp. 141-149
-
-
Coakley, K.J.1
Hale, P.D.2
-
23
-
-
0032180714
-
Signal reconstruction for non-equidistant finite length sample sets: A 'KIS' approach
-
Oct.
-
Y. Rolain, J. Schoukens, and G. Vandersteen, "Signal reconstruction for non-equidistant finite length sample sets: A 'KIS' approach," IEEE Trans. Instrum. Meas., vol. 47, no. 5, pp. 1046-1052, Oct. 1998.
-
(1998)
IEEE Trans. Instrum. Meas.
, vol.47
, Issue.5
, pp. 1046-1052
-
-
Rolain, Y.1
Schoukens, J.2
Vandersteen, G.3
-
24
-
-
0028523065
-
Compensation of timing jitter-induced distortion of sampled waveforms
-
Oct.
-
J. Verspecht, "Compensation of timing jitter-induced distortion of sampled waveforms," IEEE Trans. Instrum. Meas, vol. 43, no. 5, pp. 726-732, Oct. 1994.
-
(1994)
IEEE Trans. Instrum. Meas
, vol.43
, Issue.5
, pp. 726-732
-
-
Verspecht, J.1
-
25
-
-
0242636479
-
Adaptive characterization of jitter noise in sampled high-speed signals
-
Oct.
-
K. J. Coakley, C. M. Wang, P. D. Hale, and T. S. Clement, "Adaptive characterization of jitter noise in sampled high-speed signals," IEEE Trans. Instrum. Meas, vol. 52, no. 5, pp. 1537-1547, Oct. 2003.
-
(2003)
IEEE Trans. Instrum. Meas
, vol.52
, Issue.5
, pp. 1537-1547
-
-
Coakley, K.J.1
Wang, C.M.2
Hale, P.D.3
Clement, T.S.4
-
26
-
-
0036920755
-
Calibrating photoreceiver response to 110 GHz
-
Glasgow, U.K., Nov. 10-14
-
T. S. Clement, P. D. Hale, D. F. Williams, and J. M. Morgan, "Calibrating photoreceiver response to 110 GHz," in 15th Annu. IEEE Lasers Electro-Optics Soc. Conf. Dig., Glasgow, U.K., Nov. 10-14, 2002, pp. 877-878.
-
(2002)
15th Annu. IEEE Lasers Electro-optics Soc. Conf. Dig.
, pp. 877-878
-
-
Clement, T.S.1
Hale, P.D.2
Williams, D.F.3
Morgan, J.M.4
-
27
-
-
0031164092
-
Quantifying the maximum phase-distortion error introduced by signal samplers
-
Jun.
-
J. Verspecht, "Quantifying the maximum phase-distortion error introduced by signal samplers," IEEE Trans. Instrum. Meas, vol. 46, no. 3, pp. 660-666, Jun. 1997.
-
(1997)
IEEE Trans. Instrum. Meas
, vol.46
, Issue.3
, pp. 660-666
-
-
Verspecht, J.1
-
28
-
-
31044434362
-
Covariance based uncertainty analysis of the NIST electrooptic sampling system
-
Jan.
-
D. F. Williams, A. Lewandowski, T. S. Clement, C. M. Wang, P. D. Hale, J. M. Morgan, D. Keenan, and A. Dienstfrey, "Covariance based uncertainty analysis of the NIST electrooptic sampling system," IEEE Trans. Microw. Theory Tech., vol. 54, no. 1, pp. 481-491, Jan. 2006.
-
(2006)
IEEE Trans. Microw. Theory Tech.
, vol.54
, Issue.1
, pp. 481-491
-
-
Williams, D.F.1
Lewandowski, A.2
Clement, T.S.3
Wang, C.M.4
Hale, P.D.5
Morgan, J.M.6
Keenan, D.7
Dienstfrey, A.8
-
29
-
-
1442286596
-
Guide to the expression of uncertainty in measurement
-
BIPM, IEC, IFCC, ISO, IUPAP, and OIML, "Guide to the expression of uncertainty in measurement," Int. Org. Standard., pp. 1-101, 1993.
-
(1993)
Int. Org. Standard.
, pp. 1-101
-
-
-
30
-
-
0012326665
-
-
Hewlett-Packard, Palo Alto, CA, part 08510-10033, program revision A.05.00, data revision A.05.00
-
HP8510 Specifications and Performance Verification Analysis Software. Hewlett-Packard, Palo Alto, CA, part 08510-10033, program revision A.05.00, data revision A.05.00.
-
HP8510 Specifications and Performance Verification Analysis Software
-
-
-
31
-
-
33747270042
-
Minimum-phase calibration of sampling oscilloscopes
-
Aug.
-
A. Dienstfrey, P. D. Hale, D. A. Keenan, T. S. Clement, and D. F. Williams, "Minimum-phase calibration of sampling oscilloscopes," IEEE Trans. Microw. Theory Tech., vol. 54, no. 8, pp. 3197-3208, Aug. 2006.
-
(2006)
IEEE Trans. Microw. Theory Tech.
, vol.54
, Issue.8
, pp. 3197-3208
-
-
Dienstfrey, A.1
Hale, P.D.2
Keenan, D.A.3
Clement, T.S.4
Williams, D.F.5
|