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Electronics Letters

Volumn 38, Issue 3, 2002, Pages 125-126

Transfer of sub-5 ps electrical test pulses to coplanar and coaxial electronic devices

(5) Bieler, M a Spitzer, M a Lecher, H a Hein, G a Siegner, U a

a PHYSIKALISCH TECHNISCHE BUNDESANSTALT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; ELECTRIC LINES; ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTROOPTICAL EFFECTS; FREQUENCIES; LASER PULSES; PERMITTIVITY; PHOTOCONDUCTIVITY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR SWITCHES; WAVEGUIDES;

COAXIAL ELECTRONIC DEVICE; ELECTRO-OPTIC SAMPLING; LOCK-IN TECHNIQUE; SEMI-INSULATING GALLIUM ARSENIDE SUBSTRATE; TRANSMISSION LINE GEOMETRY; ULTRA-SHORT ELECTRICAL PULSE;

ELECTRON DEVICE TESTING;

EID: 0037204081 PISSN: 00135194 EISSN: None Source Type: Journal
DOI: 10.1049/el:20020072 Document Type: Article

Times cited : (13)

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2
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.