메뉴 건너뛰기




Volumn 15, Issue 9, 2004, Pages 1694-1701

Broadband characterization of a microwave probe for picosecond electrical pulse measurements

Author keywords

Coaxial transmission lines; Coplanar waveguides; Electro optic measurements; Time domain measurements; Transient propagation

Indexed keywords

DATA REDUCTION; ELECTRIC CONNECTORS; ELECTROOPTICAL EFFECTS; MICROWAVES; POWER TRANSMISSION; TIME DOMAIN ANALYSIS; WAVEGUIDES;

EID: 7444260791     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/15/9/004     Document Type: Article
Times cited : (16)

References (20)
  • 2
    • 0030195743 scopus 로고    scopus 로고
    • Electrooptic sampling of low temperature GaAs pulse generators for oscilloscope calibration
    • Smith A J A, Roddie A G and Henderson D 1996 Electrooptic sampling of low temperature GaAs pulse generators for oscilloscope calibration Opt. Quantum Electron. 28 933-43
    • (1996) Opt. Quantum Electron. , vol.28 , pp. 933-943
    • Smith, A.J.A.1    Roddie, A.G.2    Henderson, D.3
  • 3
    • 0023453891 scopus 로고
    • 1 THz-bandwidth prober for high-speed devices and integrated circuits
    • Valdmanis J A 1987 1 THz-bandwidth prober for high-speed devices and integrated circuits Electron. Lett. 23 1308-10
    • (1987) Electron. Lett. , vol.23 , pp. 1308-1310
    • Valdmanis, J.A.1
  • 4
    • 0031557574 scopus 로고    scopus 로고
    • 7 terahertz broadband GaP electro-optic sensor
    • Wu Q and Zhang X-C 1997 7 terahertz broadband GaP electro-optic sensor Appl. Phys. Lett. 70 1784-6
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 1784-1786
    • Wu, Q.1    Zhang, X.-C.2
  • 5
    • 0022581802 scopus 로고
    • Subpicosecond electrooptic sampling: Principles and applications
    • Valdmanis J A and Mourou G A 1986 Subpicosecond electrooptic sampling: principles and applications IEEE J. Quantum Electron. 22 69-78
    • (1986) IEEE J. Quantum Electron. , vol.22 , pp. 69-78
    • Valdmanis, J.A.1    Mourou, G.A.2
  • 6
    • 0022564739 scopus 로고
    • Electrooptic sampling in GaAs integrated circuits
    • Kolner B H and Bloom B M 1986 Electrooptic sampling in GaAs integrated circuits IEEE J. Quantum Electron. 22 79-93
    • (1986) IEEE J. Quantum Electron. , vol.22 , pp. 79-93
    • Kolner, B.H.1    Bloom, B.M.2
  • 7
    • 0001194852 scopus 로고
    • Picosecond optoelectronic switching and gating in silicon
    • Auston D H 1975 Picosecond optoelectronic switching and gating in silicon Appl. Phys. Lett. 26 101-3
    • (1975) Appl. Phys. Lett. , vol.26 , pp. 101-103
    • Auston, D.H.1
  • 10
    • 0037194858 scopus 로고    scopus 로고
    • Time-domain characterisation of non-coplanar high-frequency components up to 300 GHz
    • Bieler M, Spitzer M, Hein G and Siegner U 2002 Time-domain characterisation of non-coplanar high-frequency components up to 300 GHz Electron. Lett. 38 1038-9
    • (2002) Electron. Lett. , vol.38 , pp. 1038-1039
    • Bieler, M.1    Spitzer, M.2    Hein, G.3    Siegner, U.4
  • 11
    • 84960431527 scopus 로고    scopus 로고
    • Electro-optic sampling of coplanar to coaxial transitions to enhance the calibration of fast oscilloscopes
    • Boulder, CO
    • Smith A J A, Roddie A G and Woolliams P D 2000 Electro-optic sampling of coplanar to coaxial transitions to enhance the calibration of fast oscilloscopes 56th IEEE ARFTG Conf. (Boulder, CO)
    • (2000) 56th IEEE ARFTG Conf.
    • Smith, A.J.A.1    Roddie, A.G.2    Woolliams, P.D.3
  • 12
    • 0027726676 scopus 로고
    • Optoelectronic applications of LTMBE III-V materials
    • Whitaker J F 1993 Optoelectronic applications of LTMBE III-V materials Mater. Sci. Eng. B 22 61-7
    • (1993) Mater. Sci. Eng. B , vol.22 , pp. 61-67
    • Whitaker, J.F.1
  • 15
    • 0004217479 scopus 로고
    • Guide to the Expression of Uncertainty in Measurement (Geneva, Switzerland)
    • Guide to the Expression of Uncertainty in Measurement 1993 International Organization for Standardization (Geneva, Switzerland)
    • (1993) International Organization for Standardization
  • 16
    • 0034429468 scopus 로고    scopus 로고
    • The perfectly matched layer as lateral boundary in finite-difference transmission-line analysis
    • Tischler T and Heinrich W 2000 The perfectly matched layer as lateral boundary in finite-difference transmission-line analysis IEEE Trans. Microwave Theory Tech. 48 2249-53
    • (2000) IEEE Trans. Microwave Theory Tech. , vol.48 , pp. 2249-2253
    • Tischler, T.1    Heinrich, W.2
  • 17
    • 0037251177 scopus 로고    scopus 로고
    • Modeling dispersion and radiation characteristics of conductor-backed CPW with finite ground width
    • Schnieder F, Tischler T and Heinrich W 2003 Modeling dispersion and radiation characteristics of conductor-backed CPW with finite ground width IEEE Trans. Microwave Theory Tech. 51 137-43
    • (2003) IEEE Trans. Microwave Theory Tech. , vol.51 , pp. 137-143
    • Schnieder, F.1    Tischler, T.2    Heinrich, W.3
  • 18
    • 0033678190 scopus 로고    scopus 로고
    • Dispersion and radiation characteristics of conductor-backed CPW with finite ground width
    • Heinrich W, Schnieder F and Tischler T 2000 Dispersion and radiation characteristics of conductor-backed CPW with finite ground width Int. Microwave Symp. Digest pp 1663-6
    • (2000) Int. Microwave Symp. Digest , pp. 1663-1666
    • Heinrich, W.1    Schnieder, F.2    Tischler, T.3
  • 20
    • 0037204081 scopus 로고    scopus 로고
    • Transfer of sub-5 ps electrical test pulses to coplanar and coaxial structures
    • Bieler M, Spitzer M, Lecher H, Hein G and Siegner U 2002 Transfer of sub-5 ps electrical test pulses to coplanar and coaxial structures Electron. Lett. 38 125-6
    • (2002) Electron. Lett. , vol.38 , pp. 125-126
    • Bieler, M.1    Spitzer, M.2    Lecher, H.3    Hein, G.4    Siegner, U.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.