A reliable method for extraction of material parameters in terahertz time-domain spectroscopy

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 2, Issue 3, 1996, Pages 739-745

  Duvillaret, Lionel ^a,b,c,d   Garet, Frédéric ^a   Coutaz, Jean Louis ^a  

^a UNIVERSITÉ DE SAVOIE   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

^c Institute of Fundamental Electronics

^d University of Savoy ^*

Author keywords

[No Author keywords available]

Indexed keywords

EXTRACTION; FEATURE EXTRACTION;

TERAHERTZ TIME DOMAIN SPECTROSCOPY;

INFRARED SPECTROSCOPY;

EID: 0030230561     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/2944.571775     Document Type: Article

References (13)

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