Active nanocharacterization of nanofunctional materials by scanning tunneling microscopy

Science and Technology of Advanced Materials

Volumn 9, Issue 1, 2008, Pages

  Fujita, Daisuke ^a   Sagisaka, Keisuke ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Nanocharacterization; Nanofabrication; Nanomaterials; Nanotechnology; Scanning probe microscopy; Scanning tunneling microscopy

Indexed keywords

DEPOSITION; NANODOTS; NANOSCIENCE; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; POINT CONTACTS; SCANNING PROBE MICROSCOPY;

CONTACT FORMATION; CONTROLLED POINT; ENHANCED DIFFUSION; INJECTED CARRIERS; NANO-CHARACTERIZATION; NANOMETER SCALE STRUCTURE; SI(001) SURFACES; SUB-NANOMETER DISPLACEMENTS;

SCANNING TUNNELING MICROSCOPY;

EID: 49049089353     PISSN: 14686996     EISSN: None     Source Type: Journal    
DOI: 10.1088/1468-6996/9/1/013003     Document Type: Conference Paper

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