Deposition of gold nanofeatures on silicon samples by field-induced deposition using a scanning tunneling microscope

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 23, Issue 4, 2005, Pages 1543-1550

  Abed, H ^a   Jamgotchian, H ^a   Dallaporta, H ^a   Gely, B ^a   Bindzi, P ^a   Chatain, D ^a   Nitsche, S ^a   Chaudanson, D ^a   Cambril, E ^a,b   Safarov, V ^a   Tonneau, D ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b UNIV PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD; LITHOGRAPHY; SCANNING TUNNELING MICROSCOPY; SILICON;

ENERGY DISPERSIVE X-RAY (EDX) MICROANALYSIS; FIELD-INDUCED DEPOSITION; MICROSCOPIC CONTACT;

NANOSTRUCTURED MATERIALS;

EID: 31144459943     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1943440     Document Type: Article

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