Measurement of stress/strain in single-crystal samples using diffraction

Journal of Applied Crystallography

Volumn 39, Issue 3, 2006, Pages 320-325

  Yan, Hanfei ^a   Noyan, I C ^a  

^a Columbia University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33744487894     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889806006662     Document Type: Article

References (13)

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10. Ortner, B. (2002). Ecrs 6: Proceedings of the 6th European Conference on Residual Stresses, Vol. 404-4, pp. 323-328. Zurich-Uetikon: Trans Tech Publications.
11. Tamura, N., Celestre, R. S., MacDowell, A. A., Padmore, H. A., Spolenak, R., Valek, B. C., Chang, N. M.,Manceau, A. & Patel, J. R. (2002). Rev. Sci. Instrum. 73, 1369-1372.
12. Timoshenko, S. P. & Goodier, J. N. (1970). Theory of Elasticity, 3rd ed. New York: McGraw-Hill.
13. Yan, H. & Noyan, I. C. (2005). J. Appl. Phys. 98, 073527.