METS: A metric for electro-thermal sensitivity, and its application to FinFETs

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn , Issue , 2006, Pages 121-126

  Swahn, Brian ^a   Hassoun, Soha ^a  

^a TUFTS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COUPLED ELECTRO-THERMAL SIMULATIONS; DOUBLE-GATE DEVICE; ELECTRICAL ROBUSTNESS; ITS APPLICATIONS; OFF STATE; PERFORMANCE ROBUSTNESS; SELF-HEATING; ULTRA-THIN-BODY;

HEATING; INTEGRATED CIRCUITS; LEAKAGE CURRENTS;

MOSFET DEVICES;

EID: 48149098980     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2006.86     Document Type: Conference Paper

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