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Volumn 15, Issue 7, 1996, Pages 765-774

Layout to circuit extraction for three-dimensional thermal-electrical circuit simulation of device structures

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CALCULATIONS; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; INTEGRATED CIRCUIT LAYOUT; LINEAR INTEGRATED CIRCUITS; SEMICONDUCTOR DEVICE STRUCTURES; TEMPERATURE DISTRIBUTION; THREE DIMENSIONAL;

EID: 0030190791     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.503944     Document Type: Article
Times cited : (11)

References (12)
  • 1
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    • Electrical and thermal analysis of ultra thin SOI MOSFET's
    • Apr.
    • P. B. M. Wolbert, A. J. Mouthaan, and H. Wallinga, "Electrical and thermal analysis of ultra thin SOI MOSFET's,"in Proc. Nasecode VII, Apr.1991, pp. 183-184.
    • (1991) Proc. Nasecode VII , pp. 183-184
    • Wolbert, P.B.M.1    Mouthaan, A.J.2    Wallinga, H.3
  • 2
    • 0027591164 scopus 로고
    • Thermal modeling of power Gallium arsenide microwave integrated circuits
    • May
    • P. W. Webb, "Thermal modeling of power Gallium arsenide microwave integrated circuits,"IEEE Trans. Electron Devices,vol. 40,pp. 367-877, May 1993.
    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 367-877
    • Webb, P.W.1
  • 3
    • 0027883386 scopus 로고
    • Thermal properties of power HBT's
    • Dec.
    • J. A. Higgins, "Thermal properties of power HBT's,"IEEE Trans. Electron Devices,vol. 40,pp. 1271-2177, Dec. 1993.
    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 1271-2177
    • Higgins, J.A.1
  • 4
    • 0025512595 scopus 로고
    • Rigorous thermoclynamic treatment of heat generation and conduction in semiconductor device modeling
    • Nov.
    • G. K. Wachutka, "Rigorous thermoclynamic treatment of heat generation and conduction in semiconductor device modeling,"IEEE Trans. Computer-Aided Design,vol. 9,pp. 1141-1149, Nov. 1990.
    • (1990) IEEE Trans. Computer-Aided Design , vol.9 , pp. 1141-1149
    • Wachutka, G.K.1
  • 5
    • 0003547182 scopus 로고
    • Technology Modeling Associates, Inc., Palo Alto, CA, Mar.
    • MEDICI User's Manual,Technology Modeling Associates, Inc., Palo Alto, CA, Mar.1992.
    • (1992) MEDICI User's Manual
  • 7
    • 0019532264 scopus 로고
    • Multiple equilibrium points and their significance in the secondary breakdown of bipolar transistors
    • Feb.
    • M. Latif and P. R. Bryant, "Multiple equilibrium points and their significance in the secondary breakdown of bipolar transistors,"IEEE J. Solid-State Circuits, vol. SC-16,pp. 8-15, Feb.1981.
    • (1981) IEEE J. Solid-State Circuits, Vol. , vol.SC-16 , pp. 8-15
    • Latif, M.1    Bryant, P.R.2
  • 8
    • 0027695730 scopus 로고
    • Quasithree-dimensional modeling of transistor characteristics
    • Nov.
    • A. Sadovnikov and D. J. Roulston, "Quasithree-dimensional modeling of transistor characteristics,"IEEE Trans. Computer-Aided Design,vol. 12,pp. 1742-1748, Nov. 1993.
    • (1993) IEEE Trans. Computer-Aided Design , vol.12 , pp. 1742-1748
    • Sadovnikov, A.1    Roulston, D.J.2
  • 11
    • 0028447879 scopus 로고
    • Coupled electrothermal modeling of microheaters using SPICE
    • June
    • N. R. Swart and A. Nathan, "Coupled electrothermal modeling of microheaters using SPICE,"IEEE Trans. Electron Devices,vol. 41,pp. 920-925, June 1994.
    • (1994) IEEE Trans. Electron Devices , vol.41 , pp. 920-925
    • Swart, N.R.1    Nathan, A.2
  • 12
    • 16344396224 scopus 로고
    • 3-D thermal-electrical simulation of breakdown in a BJT using a circuit simulator and a layout-to-circuit extraction tool
    • Vienna, Austria,Sept. 6-8
    • B. H. Krabbenborg, H. C. de Graaff, A. J. Mouthaan, H. Boezen, A. Bosma, and C. Tekin, "3-D thermal-electrical simulation of breakdown in a BJT using a circuit simulator and a layout-to-circuit extraction tool,"in Proc. SISDEP'93, Vienna, Austria,Sept. 6-8, 1993, pp. 57-60.
    • (1993) Proc. SISDEP'93 , pp. 57-60
    • Krabbenborg, B.H.1    De Graaff, H.C.2    Mouthaan, A.J.3    Boezen, H.4    Bosma, A.5    Tekin, C.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.