E-Induced secondary electron emission yield of insulators and charging effects

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 244, Issue 2, 2006, Pages 307-322

  Cazaux, J ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

Charging; Electron transport; Insulators; Scanning electron microscopy; Secondary electron emission; X ray induced secondary electron emission

Indexed keywords

CHARGING; ELECTRON TRANSPORT; INSULATORS; SECONDARY ELECTRON EMISSION; X-RAY INDUCED SECONDARY ELECTRON EMISSION;

ATTENUATION; ELECTRIC CHARGE; ELECTRON EMISSION; HALIDE MINERALS; PROBABILITY;

ELECTRIC INSULATORS;

EID: 47649108071     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.10.006     Document Type: Article

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