A new method for charge trapping measurement during electron beam irradiation: Application to glass containing alkali ions and single-crystalline quartz

Journal of Physics D: Applied Physics

Volumn 37, Issue 15, 2004, Pages 2181-2190

  Fakhfakh, S ^a,b   Ghorbel, N ^a,b   Jbara, O ^a   Rondot, S ^a   Martin, D ^c   Fakhfakh, Z ^b   Kallel, A ^b  

^a 51687 Reims CDX 2   (France)

^b Faculté des Sciences de Sfax   (Tunisia)

^c SAINT GOBAIN RECHERCHE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC SPACE CHARGE; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTROSTATICS; GLASS; INSULATING MATERIALS; LEAKAGE CURRENTS; QUARTZ; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS;

CHARGE DENSITY; CHARGE TRANSPORT; ELECTRON-SOLID INTERACTION; PENETRATION DEPTHS;

ELECTRON IRRADIATION;

EID: 3843129574     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/15/021     Document Type: Article

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