A new model of dependence of secondary electron emission yield on primary electron energy for application to polymers

Journal of Physics D: Applied Physics

Volumn 38, Issue 14, 2005, Pages 2433-2441

  Cazaux, J ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ASYMPTOTIC STABILITY; BACKSCATTERING; COMPUTER SIMULATION; ELECTRON ENERGY LEVELS; ENERGY DISSIPATION; POLYAMIDES; POLYSTYRENES; PROBABILITY DISTRIBUTIONS; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION;

ATOMIC NUMBER; ATOMIC WEIGHT; EMPIRICAL GAUSSIAN DISTRIBUTION; FROZEN LIQUIDS; SECONDARY ELECTRON EMISSION (SEE);

ELECTRON EMISSION;

EID: 22144474801     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/14/020     Document Type: Article

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