Description of the influence of charging on the measurement of the secondary electron yield of MgO

Applied Surface Science

Volumn 111, Issue , 1997, Pages 259-264

  Scholtz, J J ^a   Schmitz, R W A ^a   Hendriks, B H W ^a   De Zwart, S T ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Charging; MgO; Model; Secondary electron emission

Indexed keywords

ELECTRIC CHARGE; ELECTRIC CHARGE MEASUREMENT; ELECTRON BEAMS; ELECTRON EMISSION; MATHEMATICAL MODELS; MONTE CARLO METHODS; SILICON;

SECONDARY ELECTRON EMISSION;

MAGNESIA;

EID: 0031550413     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00730-1     Document Type: Article

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