Measuring the secondary electron emission characteristic of insulators

Journal of Electron Spectroscopy and Related Phenomena

Volumn 131-132, Issue , 2003, Pages 51-60

  Hopman, H J ^a   Alberda, H ^a   Attema, I ^a   Zeijlemaker, H ^a   Verhoeven, J ^a  

^a FOM INSTITUTE DIFFER   (Netherlands)

Author keywords

Charging; Electron bombardment; Insulators; Secondary electron emission

Indexed keywords

ELECTRIC INSULATORS; ELECTRON EMISSION; ION BOMBARDMENT; LOW ENERGY ELECTRON DIFFRACTION; MICA; ULTRAHIGH VACUUM;

SECONDARY ELECTRON EMISSION;

SPECTROSCOPIC ANALYSIS;

EID: 15844397371     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(03)00091-4     Document Type: Article

References (19)

1. Boersch H., Hamisch H., Ehrlich W. Zeitschr. Phys. 15:1963;518.
2. Shih A., Yater J., Hor C., Abrams R. Appl. Surf. Sci. 111:1997;251.
3. Bruining H. The Physics and Applications of Secondary Electron Emission. 1954;Pergamon Press, London.
4. Henrich V.E. Rev. Sci. Instrum. 44:1973;456-462.
5. Henrich V.E. Rev. Sci. Instrum. 45:1974;861.
6. Hopman H.J., Verhoeven J., Scholtz J.J., Fastenau R. Appl. Surf. Sci. 111:1997;270-275.
7. Cazaux J., Lehuede P. J. Electron Spectrosc. Relat. Phenom. 59:1992;49.
8. Cazaux J. J. Electron Spectrosc. Relat. Phenom. 105:1999;155.
9. Cazaux J. J. Electron Spectrosc. Relat. Phenom. 113:2000;15.
10. Scholtz J.J., Schmitz R.W.A., Hendriks B.H.W., de Zwart S.T. Appl. Surf. Sci. 111:1997;259-264.
11. Hopman H.J., Verhoeven J. Appl. Surf. Sci. 150:1999;1.
12. Kollath R. Handbuch Phys. 21:1956;232.
13. Whetten N.R., Laponsky A.B. Phys. Rev. 107:1957;1521.
14. Hopman H.J., Zeijlemaker H., Verhoeven J. Appl. Surf. Sci. 171:2001;197.
15. Seiler H. J. Appl. Phys. 54:1983;R1-R18.
16. Goddard B.J., et al. Proceedings of the 17th International Symposium on Discharges and Electrical Insulation in Vacuum, Berkeley, CA, USA, July. 1996;. ISBN 0-7803-2906-6.
17. Kohl W.H. Handbook of Materials and Techniques For Vacuum Devices. 1967;Reinhold, New York. pp. 565-566.
18. Shih A., Hor C. IEEE Trans. Electron. Devices. 40:1993;824.
19. Krainsky I.L., Lesny G.G. Rev. Sci. Instrum. 69:1998;1916.