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Volumn 25, Issue 6, 1997, Pages 390-396
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Charging phenomena and charge compensation in AES on metal oxides and silica
a a a |
Author keywords
Aluminium oxide; Electron Stimulated Desorption; Environmental AES; Insulating surfaces; Silicon oxide
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Indexed keywords
ALUMINA;
AUGER ELECTRON SPECTROSCOPY;
CARBON;
CONTAMINATION;
CURRENT DENSITY;
DESORPTION;
ELECTRON BEAMS;
OXYGEN;
RADIATION DAMAGE;
SILICA;
ZIRCONIA;
CHARGE COMPENSATION;
CHARGING PHENOMENA;
ELECTRON STIMULATED DESORPTION;
SURFACE PHENOMENA;
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EID: 0031166351
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1096-9918(199706)25:6<390::AID-SIA247>3.0.CO;2-X Document Type: Article |
Times cited : (28)
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References (16)
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