메뉴 건너뛰기




Volumn 25, Issue 6, 1997, Pages 390-396

Charging phenomena and charge compensation in AES on metal oxides and silica

Author keywords

Aluminium oxide; Electron Stimulated Desorption; Environmental AES; Insulating surfaces; Silicon oxide

Indexed keywords

ALUMINA; AUGER ELECTRON SPECTROSCOPY; CARBON; CONTAMINATION; CURRENT DENSITY; DESORPTION; ELECTRON BEAMS; OXYGEN; RADIATION DAMAGE; SILICA; ZIRCONIA;

EID: 0031166351     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199706)25:6<390::AID-SIA247>3.0.CO;2-X     Document Type: Article
Times cited : (28)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.