Total secondary-electron yield of metals measured by a dynamic method

Journal of Applied Physics

Volumn 88, Issue 1, 2000, Pages 478-482

  Pintão, Carlos Alberto Fonzar ^a   Hessel, Roberto ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042689302     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373682     Document Type: Article

References (16)

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