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Volumn 146, Issue 1, 1999, Pages 341-346

Cold emission characterization using secondary electron emission spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

BERYLLIA; DIAMONDS; ELECTRON EMISSION; ELECTRON SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; EMISSION SPECTROSCOPY; ENERGY GAP;

EID: 0032664372     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00011-2     Document Type: Article
Times cited : (4)

References (17)
  • 11
    • 0042619307 scopus 로고    scopus 로고
    • Power semiconductor materials and devices
    • Materials Research Society, Pittsburgh, PA
    • J.E. Yater, A. Shih, R. Abrams, Power semiconductor materials and devices, MRS Symposia Proceedings No. 483, Materials Research Society, Pittsburgh, PA, 1998, p. 431.
    • (1998) MRS Symposia Proceedings No. , vol.483 , pp. 431
    • Yater, J.E.1    Shih, A.2    Abrams, R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.