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Volumn 112, Issue 13, 2008, Pages 5036-5042

Low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure investigations of molecular orientation of copper(II) phthalocyanine thin films at organic heterojunction interfaces

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CARBON; COPPER; ELECTROMAGNETIC WAVE ABSORPTION; ENERGY ABSORPTION; EXCAVATION; GRAPHITE; HETEROJUNCTIONS; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; SCANNING; SCANNING TUNNELING MICROSCOPY; SOLIDS; THICK FILMS; THIN FILMS; TUNNELING (EXCAVATION); X RAY ABSORPTION;

EID: 47149085445     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp710722s     Document Type: Article
Times cited : (62)

References (63)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.