Site-selective molecular organization in organic heterostructures

Chemistry of Materials

Volumn 18, Issue 18, 2006, Pages 4212-4214

  De Oteyza, Dimas G ^a   Barrena, Esther ^a,b   Ossó, J Oriol ^c   Sellner, Stefan ^a   Dosch, Helmut ^a,b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

^c INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRONIC PROPERTIES; FLUORINE COMPOUNDS; HETEROJUNCTIONS; MORPHOLOGY; X RAY DIFFRACTION ANALYSIS;

MOLECULAR ORGANIZATION; ORGANIC HETEROSTRUCTURES; PHTALOCYANINES;

MOLECULAR DYNAMICS;

EID: 33748867989     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm061172j     Document Type: Article

References (35)

1. (a) Forrest, S. R. Nature 2004, 428, 911.
2. (b) Kelley, T. W.; Baude, P. F.; Gerlach, C.; Ender, D. E.; Muyres, D.; Haase, M. A.; Vogel, D. E.; Theiss, S. D. Chem. Mater. 2004, 16, 4413.
3. (a) Dimitrakopoulos, C. D.; Malenfant, P. R. L. Adv. Mater. 2002, 14, 99.
4. (b) Peumans, P.; Uchida, S.; Forrest, S. R. Nature 2003, 425, 158.
5. (c) Newman, C. R.; Frisbie, C. D.; da Silva Filho, D. A.; Brédas, J.-L.; Ewbank, P. C.; Mann, K. R. Chem. Mater. 2004, 16, 4436.
6. (d) Horowitz, G. J. Mater. Res. 2004, 19, 1946.
7. (a) Koma, A. Prog. Cryst. Growth 1995, 30, 129.
8. (b) Forrest, S. R. Chem. Rev. 1997, 97, 1793.
9. (c) Witte, G.; Wöll, C. J. Mater. Res. 2004, 19, 1889.
10. (a) Yang, F.; Shtein, M.; Forrest, S. R. Nat. Mater. 2005, 4, 37.
11. (b) Kim, Y.; Cook, S.; Tuladhar, S. M.; Choulis, S. A.; Nelson, J.; Durrant, J. R.; Bradley, D. D. C.; Giles, M.; McCulloch, I.; Ha, C.-S.; Ree, M. Nat. Mater. 2006, 5, 197.
12. (e) So, F. F.; Forrest, S. R.; Shi, Y. Q.; Steier, W. H. Appl., Phys. Lett. 1990, 56, 674 (13)
13. Hoshino, A.; Isoda, S.; Kobayashi, T. J. Cryst. Growth 1991, 115, 826
14. (d) Akimichi, H.; Inoshita, T.; Hotta, S.; Noge, H.; Sakaki, H. Appl. Phys. Lett. 1993, 63, 3158.
15. (e) Anderson, M. L.; Williams, V. S.; Schuerlein, T. J.; Collins, G. E.; England, C. D.; Chau, L.-K.; Lee, P. A.; Nebesny, K. W.; Armstrong, N. R. Surf. Sci. 1994, 307-309, 551.
16. (f) Schuerlein, T. J.; Armstrong, N. R. J. Vac. Sci. Technol., A 1994, 12, 1992.
17. (g) Forrest, S. R.; Burrows, P. E.; Haskal, E. I.; So, F. F. Phys. Rev. B 1994, 49, 11309.
18. (h) Heutz, S.; Cloots, R.; Jones, T. S. Appl. Phys. Lett. 2000, 77, 3938.
19. (i) Sellam, F.; Schmitz-Hübsch. T.; Toerker, M.; Mannsfeld, S.; Proehl, H.; Fritz, T.; Leo, K.; Simpson, C.; Müllen, K. Surf. Sci. 2001, 478, 113.
20. (J) Heutz, S.; Jones, T. S. J. Appl. Phys. 2002, 92, 3039.
21. (k) Yim, S.; Heutz, S.; Jones, T. S. Phys. Rev. B 2003, 67, 165308.
22. Bao, Z.; Lovinger, A. J.; Brown, J. Am. Chem. Soc. 1998, 120, 207.
23. (a) Dimitrakopoulos, C. D.; Brown, A. R.; Pomp, A. J. Appl. Phys. 1996, 80, 2501.
24. (b) Ruiz, R.; Mayer, A. C.; Malliaras, G. G.; Nickel, B.; Scoles, G.; Kazimirov. A.; Kim, H.; Headrick, R. L.; Islam, Z. Appl. Phys. Lett. 2004, 85, 4926.
25. (c) Mattheus, C. C.; Dros, A. B.; Baas, J.; Oostergetel, G. T.; Meetsma, A.; de Boer, J. L.; Palstra, T. T. M. Synth. Met. 2003, 138, 475.
26. (a) de Oteyza, D. G.; Barrena, E.; Ossó, J. O.; Dosch, H.; Meyer, S.; Pflaum, J. Appl. Phys. Lett. 2005, 87, 183504.
27. (b) Ossó, J. O.; Schreiber, F.; Alonso, M. I.; Garriga, M.; Barrena, E.; Dosch, H. Org. Electron. 2004, 5, 135.
28. Dürr, A. C.; Nickel, B.; Sharma, V.; Täffner, U.; Dosch, H. Thin Solid Films 2006, 503, 127.
29. For this higher substrate temperature (and due to the higher pentacene thickness), the coexistent formation of pentacene thin-film and bulk phases takes place (see ref 6), as evidenced by the emergence of additional Bragg reflections corresponding to a layer spacing of 14.5 Å.
30. The images have been obtained with a commercial Nanotec scanning probe microscope in tapping mode (under ambient conditions) because in contact mode the F16CuPc molecules were swept by the AFM tip even at minimized applied loads.
31. Garcia, R.; Perez, R. Surf. Sci. Rep. 2002, 47, 197.
32. Northrup, J. E.; Tiago, M. L.; Louie, S. G. Phys. Rev. B 2002, 66, 121404.
33. (a) Ossó, J. O.; Schreiber, F.; Kruppa, V.; Dosch, H.; Garriga, M.; Alonso, M. I. Cerdeira, F. Adv. Funct. Mater. 2002, 12, 455.
34. (b) Barrena, E.; Ossó, J. O.; Schreiber, F.; Garriga, M.; Alonso, M. I.; Dosch, H. J. Mater. Res. 2004, 19, 2061.
35. Oh, Y.; Pyo, S.; Yi, M. H.; Kwon, S.-K. Org. Electron. 2006, 7, 77.