Thickness-dependent structural transitions in fluorinated copper-phthalocyanine (F16CuPc) films

Journal of the American Chemical Society

Volumn 128, Issue 47, 2006, Pages 15052-15053

  De Oteyza, Dimas G ^a   Barrena, Esther ^a,b   Ossó, J Oriol ^c   Sellner, Stefan ^a   Dosch, Helmut ^a,b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

^c INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; PHTHALOCYANINE;

ANISOTROPY; ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; FILM; FLUORINATION; THICKNESS; X RAY DIFFRACTION;

EID: 33845227120     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja064641r     Document Type: Article

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15. bilayer-structure with a correlation length of ∼120 Å.
16. The X-ray intensities have been corrected for the polarization factor. Debye Waller factor (DWF) corrections are estimated to be rather small for these low-order reflections: The thermal DWF (associated with a bulk Debye temperature of 199 K (Bell, N. A.; Brooks, J. S.; Robinson, J. K.; Thorpe, S. C. J. Chem. Soc., Faraday Trans. 1998, 94, 3155-3159)) results by way of example into exp(-2M) = 0.99 for the (01) reflection.
17. Notice that deviations from the assumed rectangular unit cell, or a molecular tilt with respect to the surface normal, could slightly change the absolute values of ω, but would still lead to a similar reduction of the tilt angle.
18. 16CuPc.
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