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Volumn 149, Issue 7, 2002, Pages
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High-resolution electrochemical, electrical, and structural characterization of a dimensionally stable Ti/TiO2/Pt electrode
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRIC CONDUCTIVITY;
ION BEAMS;
MICROPOROUS MATERIALS;
OHMIC CONTACTS;
PLATINUM;
SUBSTRATES;
TITANIUM DIOXIDE;
SCANNING ELECTROCHEMICAL MICROSCOPY (SECM);
ELECTROCHEMICAL ELECTRODES;
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EID: 0036641654
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1479158 Document Type: Article |
Times cited : (41)
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References (55)
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