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Volumn 4, Issue 1, 2001, Pages

Scanning electrochemical microscopy of electroactive defect sites in the native oxide film on aluminum

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROACTIVE DEFECTS; NATIVE OXIDE FILMS; NITROBENZENE; SCANNING ELECTROCHEMICAL MICROSCOPY;

EID: 0035134691     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1344278     Document Type: Article
Times cited : (81)

References (19)
  • 19


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.