CNTFET basics and simulation

Proceedings - 2006 International Conference on Design and Test of Integrated Systems in Nanoscale Technology, IEEE DTIS 2006

Volumn , Issue , 2006, Pages 28-33

  Dang, T ^a   Anghel, L ^a   Leveugle, R ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

NANOTECHNOLOGY;

COMPACT MODEL; CURRENT LEVELS; DEVICE CHARACTERISTICS; NANOTUBE DIAMETERS; TUBE DIAMETERS;

THRESHOLD VOLTAGE;

EID: 44949143941     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/dtis.2006.1708731     Document Type: Conference Paper

References (14)

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