Backside optical emission diagnostics for excess IDDQ

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1997, Pages 23-26

  Kash, J A ^a   Tsang, J C ^a   Rizzolo, Richard F ^a   Patel, Atul K ^a   Shore, Aaron D ^a  

^a IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; LIGHT EMISSION; MICROPROCESSOR CHIPS;

BACKSIDE OPTICAL EMISSION DIAGNOSTICS;

INTEGRATED CIRCUIT TESTING;

EID: 0030712594     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)