Picosecond hot electron light emission from submicron complementary metal-oxide-semiconductor circuits

Applied Physics Letters

Volumn 70, Issue 7, 1997, Pages 889-891

  Tsang, J C ^a   Kash, J A ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRONS; HOT CARRIERS; LIGHT EMISSION; MONTE CARLO METHODS; MOSFET DEVICES; PHOTODIODES; SEMICONDUCTING SILICON;

AVALANCHE PHOTODIODES; MICROCHANNEL PLATE; TIME TO AMPLITUDE CONVERTER;

LOGIC GATES;

EID: 0031077309     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118305     Document Type: Article

References (13)

1. S. Tam and C. Hu, IEEE Trans. Electron Devices 31, 1264 (1984); Y. Uraoka, N. Tsutsu, T. Morii, and K. Tsuji, ibid. 40, 1426 (1993).
2. S. Tam and C. Hu, IEEE Trans. Electron Devices 31, 1264 (1984); Y. Uraoka, N. Tsutsu, T. Morii, and K. Tsuji, ibid. 40, 1426 (1993).
3. "The Sematech Failure Analysis Roadmap," ISTFA'95 21st International Symposium for Testing and Failure Analysis, Santa Clara, CA, 6-10 November, 1995 (unpublished).
4. J. Higman, K. Hess, C. G. Hwang, and R. W. Dutton, IEEE Trans. Electron Devices 36, 930 (1989); J. Bude, N. Sano, and A. Yoshii, Phys. Rev. B 45, 5848 (1992); D. Ventura, A. Gnudi, and G. Baccarani, Numer. Funct. Anal. Optim. 16, 565 (1995).
5. J. Higman, K. Hess, C. G. Hwang, and R. W. Dutton, IEEE Trans. Electron Devices 36, 930 (1989); J. Bude, N. Sano, and A. Yoshii, Phys. Rev. B 45, 5848 (1992); D. Ventura, A. Gnudi, and G. Baccarani, Numer. Funct. Anal. Optim. 16, 565 (1995).
6. J. Higman, K. Hess, C. G. Hwang, and R. W. Dutton, IEEE Trans. Electron Devices 36, 930 (1989); J. Bude, N. Sano, and A. Yoshii, Phys. Rev. B 45, 5848 (1992); D. Ventura, A. Gnudi, and G. Baccarani, Numer. Funct. Anal. Optim. 16, 565 (1995).
7. L. Selma, Microelectron. Eng. 28, 249 (1995).
8. N. H. E. Weste and K. Eshraghian, Principles of CMOS VLSI Design (Addison-Wesley, Reading, MA, 1993), Chap. 4.
9. J. C. Tsang, in Light Scattering in Solids V, edited by G. Guntherodt and M. Cardona (Springer, Berlin, 1988), Chap. 6; W. G. McMullan, S. Charbonneau, and M. L. W. Thewalt, Rev. Sci. Instrum. 58, 1626 (1987).
10. J. C. Tsang, in Light Scattering in Solids V, edited by G. Guntherodt and M. Cardona (Springer, Berlin, 1988), Chap. 6; W. G. McMullan, S. Charbonneau, and M. L. W. Thewalt, Rev. Sci. Instrum. 58, 1626 (1987).
11. C. F. Hawkins, J. M. Snoden, E. I. Cole, Jr., and E. S. Snyder, Proceedings of the International Symposium for Testing and Failure Analysis (ISTFA'90, USA), 1990 (unpublished), p. 55.
12. J. A. Kash and J. C. Tsang (unpublished).
13. S. Laux (private communication).