메뉴 건너뛰기




Volumn 16, Issue 6, 2008, Pages 693-706

Enhancement of fault injection techniques based on the modification of VHDL code

Author keywords

Dependability validation; Fault tolerance; Hardware description languages (HDLs); Logic design; Mutants; Physical faults; Saboteurs; VHDL based fault injection; VLSI

Indexed keywords

CODES (SYMBOLS); FAULT TOLERANCE; LOGIC DESIGN; VLSI CIRCUITS;

EID: 44249102333     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2008.2000254     Document Type: Conference Paper
Times cited : (67)

References (26)
  • 1
    • 0036922146 scopus 로고    scopus 로고
    • Impact of deep submicron technology on dependability of VLSI circuits
    • C. Constantinescu, "Impact of deep submicron technology on dependability of VLSI circuits," in Proc. DSN, 2002, pp. 205-209.
    • (2002) Proc. DSN , pp. 205-209
    • Constantinescu, C.1
  • 2
    • 0036931372 scopus 로고    scopus 로고
    • Modeling the effect of technology trends on soft error rate of combinational logic
    • P. Shivakumar, M. Kistler, S. W. Keckler, D. Burger, and L. Alvisi, "Modeling the effect of technology trends on soft error rate of combinational logic," in Proc. DSN, 2002, pp. 389-398.
    • (2002) Proc. DSN , pp. 389-398
    • Shivakumar, P.1    Kistler, M.2    Keckler, S.W.3    Burger, D.4    Alvisi, L.5
  • 3
    • 27544440237 scopus 로고    scopus 로고
    • Neutron SER characterization of microprocessors
    • C. Constantinescu, "Neutron SER characterization of microprocessors," in Proc. DSN, 2005, pp. 754-759.
    • (2005) Proc. DSN , pp. 754-759
    • Constantinescu, C.1
  • 7
    • 84942514785 scopus 로고    scopus 로고
    • VERIFY: Evaluation of reliability using VHDL-models with embedded fault descriptions
    • V. Sieh, O. Tschäche, and F. Balbach, "VERIFY: Evaluation of reliability using VHDL-models with embedded fault descriptions," in Proc. FTCS, .1997, pp. 32-36.
    • (1997) Proc. FTCS , pp. 32-36
    • Sieh, V.1    Tschäche, O.2    Balbach, F.3
  • 8
    • 0003098818 scopus 로고    scopus 로고
    • A study of the effects of transient fault injection into the VHDL model of a fault-tolerant microcomputer system
    • D. Gil, J. Gracia, J. C. Baraza, and P. J. Gil, "A study of the effects of transient fault injection into the VHDL model of a fault-tolerant microcomputer system," in Proc. IOLTW, 2000, pp. 73-79.
    • (2000) Proc. IOLTW , pp. 73-79
    • Gil, D.1    Gracia, J.2    Baraza, J.C.3    Gil, P.J.4
  • 9
    • 24944560513 scopus 로고    scopus 로고
    • Impact of faults in combinational logic of commercial microcontrollers
    • Heidelberg, Germany: Springer-Verlag
    • D. Gil, J. Gracia, J. C. Baraza, and P. J. Gil, "Impact of faults in combinational logic of commercial microcontrollers," in Lecture Notes in Computer Science. Heidelberg, Germany: Springer-Verlag, 2005, pp. 379-390.
    • (2005) Lecture Notes in Computer Science , pp. 379-390
    • Gil, D.1    Gracia, J.2    Baraza, J.C.3    Gil, P.J.4
  • 12
    • 27544444307 scopus 로고    scopus 로고
    • MEHSTO-L: A VHDL-based fault injection tool for the experimental assessment of fault tolerance
    • J. Boue, P. Pétillon, and Y. Crouzet, "MEHSTO-L: A VHDL-based fault injection tool for the experimental assessment of fault tolerance," in Proc. FTCS, 1998, pp. 168-173.
    • (1998) Proc. FTCS , pp. 168-173
    • Boue, J.1    Pétillon, P.2    Crouzet, Y.3
  • 13
    • 0026173425 scopus 로고
    • On behavior fault modeling for digital design
    • Jun
    • S. Ghosh, and T. J. Chakraborty, "On behavior fault modeling for digital design," J. Election. Test., vol. 2, no. 2, pp. 135-151, Jun. 1991.
    • (1991) J. Election. Test , vol.2 , Issue.2 , pp. 135-151
    • Ghosh, S.1    Chakraborty, T.J.2
  • 14
    • 0002715761 scopus 로고
    • Test generation and fault simulation for behavioural models
    • J. M. Schoen, Ed. Englewood Cliffs, NJ: Prentice-Hall
    • J. R. Armstrong, F.-S. Lam, and P. C. Ward, "Test generation and fault simulation for behavioural models," in Performance and Fault Modelling with VHDL, J. M. Schoen, Ed. Englewood Cliffs, NJ: Prentice-Hall, 1992, pp. 240-303.
    • (1992) Performance and Fault Modelling with VHDL , pp. 240-303
    • Armstrong, J.R.1    Lam, F.-S.2    Ward, P.C.3
  • 15
    • 0030402886 scopus 로고    scopus 로고
    • A fault injection technique for VHDL behavioral-level models
    • Dec
    • T. A. DeLong, B. W. Johnson, and J. A. Profeta, III, "A fault injection technique for VHDL behavioral-level models," IEEE Des. Test Comput., vol. 13, no. 4, pp. 24-33, Dec. 1996.
    • (1996) IEEE Des. Test Comput , vol.13 , Issue.4 , pp. 24-33
    • DeLong, T.A.1    Johnson, B.W.2    Profeta III, J.A.3
  • 16
    • 0030388487 scopus 로고    scopus 로고
    • Improving gate level fault coverage by RTL fault grading
    • W. Mao and R. K. Gulati, "Improving gate level fault coverage by RTL fault grading," in Proc. ITC, 1996, pp. 150-159.
    • (1996) Proc. ITC , pp. 150-159
    • Mao, W.1    Gulati, R.K.2
  • 17
    • 0030398788 scopus 로고    scopus 로고
    • System level fault simulation
    • P. Sanchez and I. Hidalgo, "System level fault simulation," in Proc. ITC, .1996, pp. 732-740.
    • (1996) Proc. ITC , pp. 732-740
    • Sanchez, P.1    Hidalgo, I.2
  • 18
    • 0042092305 scopus 로고    scopus 로고
    • A test evaluation technique for VHDL circuits using register-transfer level fault modeling
    • Aug
    • P. A. Thaker, V. D. Agrawal, and M. E. Zaghloul, "A test evaluation technique for VHDL circuits using register-transfer level fault modeling," IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst., vol. 22, no. 8, pp. 1104-1113, Aug. 2003.
    • (2003) IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst , vol.22 , Issue.8 , pp. 1104-1113
    • Thaker, P.A.1    Agrawal, V.D.2    Zaghloul, M.E.3
  • 19
    • 33745497169 scopus 로고    scopus 로고
    • A new approach for early dependability evaluation based on formal property checking and controlled mutations
    • R. Leveugle, "A new approach for early dependability evaluation based on formal property checking and controlled mutations," in Proc. DATE, 2005, pp. 260-265.
    • (2005) Proc. DATE , pp. 260-265
    • Leveugle, R.1
  • 20
    • 33846616901 scopus 로고    scopus 로고
    • Dependability evaluation of altera FPGA-based embedded systems subjected to SEUs
    • Feb.-Mar
    • H. R. Zarandi and S. G. Miremadi, "Dependability evaluation of altera FPGA-based embedded systems subjected to SEUs," Microelectron. Reliab., vol. 47, no. 2-3, pp. 461-470, Feb.-Mar. 2007.
    • (2007) Microelectron. Reliab , vol.47 , Issue.2-3 , pp. 461-470
    • Zarandi, H.R.1    Miremadi, S.G.2
  • 22
    • 0036534998 scopus 로고    scopus 로고
    • A prototype of a VHDL-based fault injection tool: Description and application
    • Apr
    • J. C. Baraza, J. Gracia, D. Gil, and P. J. Gil, "A prototype of a VHDL-based fault injection tool: Description and application," J. Syst Arch., vol. 47, no. 10, pp. 847-867, Apr. 2002.
    • (2002) J. Syst Arch , vol.47 , Issue.10 , pp. 847-867
    • Baraza, J.C.1    Gracia, J.2    Gil, D.3    Gil, P.J.4
  • 23
    • 19944425021 scopus 로고    scopus 로고
    • VHDL simulation-based fault injection techniques
    • A. Benso and P. Prinetto, Eds. Dordrecht, The Netherlands: Kluwer Academic, ch. 4.1, pp
    • D. Gil, J. C. Baraza, J. Gracia, and P. J. Gil, "VHDL simulation-based fault injection techniques," in Fault Injection Techniques and Tools for VLSI Reliability Evaluation, A. Benso and P. Prinetto, Eds. Dordrecht, The Netherlands: Kluwer Academic, 2003, ch. 4.1, pp. 159-176.
    • (2003) Fault Injection Techniques and Tools for VLSI Reliability Evaluation , pp. 159-176
    • Gil, D.1    Baraza, J.C.2    Gracia, J.3    Gil, P.J.4
  • 24
    • 0037244941 scopus 로고    scopus 로고
    • Study, comparison and application of different VHDL-based fault injection techniques for the experimental validation of a fault-tolerant system
    • Jan
    • D. Gil, J. Gracia, J. C Baraza, and P. J. Gil, "Study, comparison and application of different VHDL-based fault injection techniques for the experimental validation of a fault-tolerant system," Microelectron. J., vol. 34, no. 1, pp. 41-51, Jan. 2003.
    • (2003) Microelectron. J , vol.34 , Issue.1 , pp. 41-51
    • Gil, D.1    Gracia, J.2    Baraza, J.C.3    Gil, P.J.4
  • 25
    • 0029746899 scopus 로고    scopus 로고
    • A fault model for VHDL descriptions at the register transfer level
    • T. Riesgo and J. Uceda, "A fault model for VHDL descriptions at the register transfer level," in Proc. EURO-DAC/EURO-VHDL, 1996, pp. 462-5467.
    • (1996) Proc. EURO-DAC/EURO-VHDL , pp. 462-5467
    • Riesgo, T.1    Uceda, J.2
  • 26
    • 33846583638 scopus 로고    scopus 로고
    • Improvement of fault injection techniques based on VHDL code modification
    • J. C. Baraza, J. Gracia, D. Gil, and P. J. Gil, "Improvement of fault injection techniques based on VHDL code modification," in Proc. HLDVT, 2005, pp. 19-26.
    • (2005) Proc. HLDVT , pp. 19-26
    • Baraza, J.C.1    Gracia, J.2    Gil, D.3    Gil, P.J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.