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Volumn 13, Issue 4, 1996, Pages 24-33

A fault injection technique for VHDL behavioral-level models

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; COMPUTER ARCHITECTURE; COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; CONTROL SYSTEM ANALYSIS; INTEGRATED CIRCUIT MANUFACTURE; LOGIC DESIGN; MICROELECTRONIC PROCESSING; PARAMETER ESTIMATION; RELIABILITY;

EID: 0030402886     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.544533     Document Type: Review
Times cited : (94)

References (10)
  • 1
    • 0026709992 scopus 로고
    • Two Fault Injection Techniques for Test of Fault Handling Mechanisms
    • IEEE Computer Soc. Press, Los Alamitos, Calif.
    • J. Karlsson, U. Gunneflo, and P. Liden, "Two Fault Injection Techniques for Test of Fault Handling Mechanisms," Proc. Int'l Test Conf., IEEE Computer Soc. Press, Los Alamitos, Calif., 1991, pp. 140-149.
    • (1991) Proc. Int'l Test Conf. , pp. 140-149
    • Karlsson, J.1    Gunneflo, U.2    Liden, P.3
  • 3
    • 0024138092 scopus 로고
    • FIAT-Fault Injection Based Automated Testing Environment
    • IEEE CS Press
    • Z. Segall et al., "FIAT-Fault Injection Based Automated Testing Environment," Proc. 18th Int'l Symp. Fault-Tolerant Computing, IEEE CS Press, 1988, pp. 102-107.
    • (1988) Proc. 18th Int'l Symp. Fault-Tolerant Computing , pp. 102-107
    • Segall, Z.1
  • 5
    • 3643086313 scopus 로고
    • A Simulation-Based Fault Injection Experiment to Evaluate Self-Test Diagnostics for a FaultTolerant Computer
    • IEEE
    • R.L. Baker and L.S. Mangum, "A Simulation-Based Fault Injection Experiment to Evaluate Self-Test Diagnostics for a FaultTolerant Computer," Proc. IEEE/AIAA Eighth Digital Avionics Systems Conf., IEEE, 1988, pp. 220-226.
    • (1988) Proc. IEEE/AIAA Eighth Digital Avionics Systems Conf. , pp. 220-226
    • Baker, R.L.1    Mangum, L.S.2
  • 6
    • 27544463457 scopus 로고
    • FOCUS: An Experimental Environment for Fault Sensitivity Analysis
    • Dec.
    • S.G Choi and R.K. Iyer, "FOCUS: An Experimental Environment for Fault Sensitivity Analysis," IEEE Trans. Computers, Vol. 41, No. 12, Dec. 1992, pp. 1515-1526.
    • (1992) IEEE Trans. Computers , vol.41 , Issue.12 , pp. 1515-1526
    • Choi, S.G.1    Iyer, R.K.2
  • 9
    • 0029207732 scopus 로고
    • A Method to Determine Equivalent Fault Classes for Permanent and Transient Faults
    • IEEE
    • D.T. Smith et al., "A Method to Determine Equivalent Fault Classes for Permanent and Transient Faults," Proc. Ann. Reliability and Maintainability Symp., IEEE, 1995, pp. 418-424.
    • (1995) Proc. Ann. Reliability and Maintainability Symp. , pp. 418-424
    • Smith, D.T.1
  • 10
    • 0029207733 scopus 로고
    • A Fault-List Generation Algorithm for the Evaluation of System Coverage
    • IEEE
    • D.T. Smith et al., "A Fault-List Generation Algorithm for the Evaluation of System Coverage," Proc. Ann. Reliability and Maintainability Symp., IEEE, 1995, pp. 425-432.
    • (1995) Proc. Ann. Reliability and Maintainability Symp. , pp. 425-432
    • Smith, D.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.