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Volumn , Issue , 2002, Pages 117-127

Bit flip injection in processor-based architectures: A case study

Author keywords

[No Author keywords available]

Indexed keywords

ARCHITECTURE; ERRORS;

EID: 84962664102     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OLT.2002.1030194     Document Type: Conference Paper
Times cited : (32)

References (14)
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  • 3
    • 0031123369 scopus 로고    scopus 로고
    • Fault Injection Techniques and Tools
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    • M. C. Hsueh, T. K Tsai and R. K. Iyer "Fault Injection Techniques and Tools" Computer , Volume: 30 Issue: 4 , April 1997, pp. 75-82
    • (1997) Computer , vol.30 , Issue.4 , pp. 75-82
    • Hsueh, M.C.1    K Tsai, T.2    Iyer, R.K.3
  • 4
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    • A method for characterizing microprocessor's vulnerability to SEU
    • Dec
    • J. H. Elder, J. Osborn, W.A. Kolasinsky, R. Koga, A method for characterizing microprocessor's vulnerability to SEU, IEEE Trans. on Nucl. Sci., vol 35, No 6, pp. 1679- 1681, Dec. 1988
    • (1988) IEEE Trans. on Nucl. Sci. , vol.35 , Issue.6 , pp. 1679-1681
    • Elder, J.H.1    Osborn, J.2    Kolasinsky, W.A.3    Koga, R.4
  • 5
    • 0032002385 scopus 로고
    • Xception : A technique for the experimental evaluation of dependability in modern computers
    • February
    • J. Carreira, H. Madeira, J. G. Silva, Xception : a technique for the experimental evaluation of dependability in modern computers, IEEE Transactions in Software Engineering, Vol. 24, No 2, pp. 125-136, February 1988.
    • (1988) IEEE Transactions in Software Engineering , vol.24 , Issue.2 , pp. 125-136
    • Carreira, J.1    Madeira, H.2    Silva, J.G.3
  • 10
    • 0034450666 scopus 로고    scopus 로고
    • Predicting error rate for microprocessor-based digital architectures through C.E.U. (Code Emulation Upset) Injection
    • Dec
    • R. Velazco, S. Rezgui and R. Ecoffet "Predicting error rate for microprocessor-based digital architectures through C.E.U. (Code Emulation Upset) Injection", IEEE Trans. on Nuclear Sci. , Vol 47, Dec 2000 pp. 2405-2411.
    • (2000) IEEE Trans. on Nuclear Sci. , vol.47 , pp. 2405-2411
    • Velazco, R.1    Rezgui, S.2    Ecoffet, R.3
  • 11
    • 0012508328 scopus 로고    scopus 로고
    • A New Methodology for the Simulation of Soft Errors on Microprocessors : A Case Study
    • MAPLD 2000 Military and Aerospace of Programmable Devices and Technologies, Laurel, Maryland (USA), Session B, 26-28 Sept. To be published
    • S. Rezgui, R. Velazco, R. Ecoffet, S. Rodríguez, J.R. Mingo, A New Methodology for the Simulation of Soft Errors on Microprocessors : A Case Study, MAPLD 2000 Military and Aerospace of Programmable Devices and Technologies, Laurel, Maryland (USA), Vol. 1, Session B, 26-28 Sept. 2000. To be published at JSR (Journal of Space Rockets).
    • (2000) JSR (Journal of Space Rockets) , vol.1
    • Rezgui, S.1    Velazco, R.2    Ecoffet, R.3    Rodríguez, S.4    Mingo, J.R.5
  • 12
    • 0002852824 scopus 로고    scopus 로고
    • THESIC: A testbed suitable for the qualification of integrated circuits devoted to operate in harsh environment
    • Sitges, (Espagne), 27-29 Mai
    • R. Velazco, Ph. Cheynet, A. Bofill, R. Ecoffet, THESIC: A testbed suitable for the qualification of integrated circuits devoted to operate in harsh environment, IEEE European Test Workshop (ETW'98), Sitges, (Espagne), pp. 89-90, 27-29 Mai 1998.
    • (1998) IEEE European Test Workshop (ETW'98) , pp. 89-90
    • Velazco, R.1    Cheynet, Ph.2    Bofill, A.3    Ecoffet, R.4
  • 13
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    • Assessing the soft error rate of digital architectures devoted to operate in radiation environment: A case studied
    • Cancun (Mexique), 11-14 février 2000
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    • LATW 2001 ( IEEE Latin-American Test Workshop)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.