Impact of deep submicron technology on dependability of VLSI circuits

Proceedings of the 2002 International Conference on Dependable Systems and Networks

Volumn , Issue , 2002, Pages 205-209

  Constantinescu, Cristian ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP SUBMICRON TECHNOLOGY; POWER VOLTAGES; SEMICONDUCTOR INDUSTRY;

ELECTRIC POTENTIAL; FAULT TOLERANT COMPUTER SYSTEMS; INTEGRATED CIRCUIT LAYOUT; MICROPROCESSOR CHIPS; TRANSISTORS;

VLSI CIRCUITS;

EID: 0036922146     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSN.2002.1028901     Document Type: Conference Paper

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