A new approach for early dependability evaluation based on formal property checking and controlled mutations

Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005

Volumn 2005, Issue , 2005, Pages 260-265

  Leveugle, R ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT TOLERANT COMPUTER SYSTEMS; IDENTIFICATION (CONTROL SYSTEMS); MATHEMATICAL MODELS; PROBABILITY;

DEPENDABILITY EVALUATION; FUNCTIONAL IMPACT; MUTATIONS;

INTEGRATED CIRCUITS;

EID: 33745497169     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2005.8     Document Type: Conference Paper

References (17)

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