Neutron ser characterization of microprocessors

Proceedings of the International Conference on Dependable Systems and Networks

Volumn , Issue , 2005, Pages 754-759

  Constantinescu, Cristian ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATIONAL LOGIC; HIGH-ENERGY NEUTRONS; NEUTRON SER; SEMICONDUCTOR TECHNOLOGY;

BENCHMARKING; COSMIC RAYS; ELECTRIC CHARGE; ERROR DETECTION; FORMAL LOGIC; NEUTRONS; RELIABILITY THEORY; SEMICONDUCTOR DEVICES; VLSI CIRCUITS; VOLTAGE CONTROL;

MICROPROCESSOR CHIPS;

EID: 27544440237     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSN.2005.69     Document Type: Conference Paper

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