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Volumn 27, Issue 6, 2008, Pages 1117-1127

Bridging fault test method with adaptive power management awareness

Author keywords

Adaptive power management (APM); Resistive bridging faults (RBFs); Test generation; Test points

Indexed keywords

ELECTRIC BATTERIES; ELECTRIC POTENTIAL; FAILURE ANALYSIS; INTEGRATED CIRCUITS;

EID: 44149090079     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2008.923247     Document Type: Article
Times cited : (31)

References (19)
  • 2
    • 0036917242 scopus 로고    scopus 로고
    • Combined dynamic voltage scaling and adaptive body biasing for lower power microprocessors under dynamic workloads
    • San. Jose, CA, Nov
    • S. M. Martin, K. Flautner, T. Mudge, and D. Blaauw, "Combined dynamic voltage scaling and adaptive body biasing for lower power microprocessors under dynamic workloads," in Proc. ICCAD, San. Jose, CA, Nov. 2002, pp. 721-725.
    • (2002) Proc. ICCAD , pp. 721-725
    • Martin, S.M.1    Flautner, K.2    Mudge, T.3    Blaauw, D.4
  • 3
    • 44149103318 scopus 로고    scopus 로고
    • Nov. 2007, Online, Available
    • Intel: PXA270 Processor Datasheet, Nov. 2007. [Online]. Available: http://www.phytec.com/pdf/datasheets/PX.A270_DS.pdf
    • Intel: PXA270 Processor Datasheet
  • 4
    • 0029713161 scopus 로고    scopus 로고
    • Bridging fault coverage improvement by power supply control
    • Apr
    • M. Renovell, P. Huc, and Y. Bertrand, "Bridging fault coverage improvement by power supply control," in Proc. VTS, Apr. 1996, pp. 338-343.
    • (1996) Proc. VTS , pp. 338-343
    • Renovell, M.1    Huc, P.2    Bertrand, Y.3
  • 5
    • 0030402883 scopus 로고    scopus 로고
    • Fault coverage analysis for physically-based CMOS bridging faults at different power supply voltages
    • Oct
    • Y. Liao and D. M. H. Walker, "Fault coverage analysis for physically-based CMOS bridging faults at different power supply voltages," in Proc. ITC, Oct. 1996, pp. 767-775.
    • (1996) Proc. ITC , pp. 767-775
    • Liao, Y.1    Walker, D.M.H.2
  • 6
    • 0033318725 scopus 로고    scopus 로고
    • Resistive bridge fault modeling, simulation and test generation
    • Atlantic City, NJ, Sep
    • V. R. Sar-Dessai and D. M. H. Walker, "Resistive bridge fault modeling, simulation and test generation," in Proc. ITC, Atlantic City, NJ, Sep. 1999, pp. 596-605.
    • (1999) Proc. ITC , pp. 596-605
    • Sar-Dessai, V.R.1    Walker, D.M.H.2
  • 7
    • 0036445141 scopus 로고    scopus 로고
    • Comparison of IDDQ testing and very-low voltage testing
    • Oct
    • B. Kruseman, S. van den Oetelaar, and J. Ruis, "Comparison of IDDQ testing and very-low voltage testing," in Proc. ITC, Oct. 2002, pp. 964-973.
    • (2002) Proc. ITC , pp. 964-973
    • Kruseman, B.1    van den Oetelaar, S.2    Ruis, J.3
  • 8
    • 3142723471 scopus 로고    scopus 로고
    • The pros and cons of very-low-voltage testing: An analysis based on resistive bridging faults
    • Apr
    • P. Engelke, I. Polian, M. Renovell, B. Seshadri, and B. Becker, "The pros and cons of very-low-voltage testing: An analysis based on resistive bridging faults," in Proc. VTS, Apr. 2004, pp. 171-178.
    • (2004) Proc. VTS , pp. 171-178
    • Engelke, P.1    Polian, I.2    Renovell, M.3    Seshadri, B.4    Becker, B.5
  • 10
    • 0032635467 scopus 로고    scopus 로고
    • Detection of defects using fault model oriented test sequences
    • Feb
    • M. Renovell, F. Azais, and Y. Bertrand, "Detection of defects using fault model oriented test sequences," J. Electron. Test.: Theory Appl., vol. 14, no. 1/2, pp. 13-22, Feb. 1999.
    • (1999) J. Electron. Test.: Theory Appl , vol.14 , Issue.1-2 , pp. 13-22
    • Renovell, M.1    Azais, F.2    Bertrand, Y.3
  • 11
    • 0034478411 scopus 로고    scopus 로고
    • Precise test generation for resistive bridging faults of CMOS combinational circuits
    • Oct
    • T. Maeda and K. Kinoshita, "Precise test generation for resistive bridging faults of CMOS combinational circuits," in Proc. IEEE ITC, Oct. 2000, pp. 510-519.
    • (2000) Proc. IEEE ITC , pp. 510-519
    • Maeda, T.1    Kinoshita, K.2
  • 12
    • 33744496055 scopus 로고    scopus 로고
    • An unified fault model and test generation procedure for interconnect open and bridges
    • May
    • G. Chen, S. Reddy, I. Pomeranz, J. Rajski, P. Engelke, and B. Becker, "An unified fault model and test generation procedure for interconnect open and bridges," in Proc. IEEE ETS, May 2005, pp. 22-27.
    • (2005) Proc. IEEE ETS , pp. 22-27
    • Chen, G.1    Reddy, S.2    Pomeranz, I.3    Rajski, J.4    Engelke, P.5    Becker, B.6
  • 13
    • 38649124402 scopus 로고    scopus 로고
    • Automatic test pattern generation for resistive bridging faults
    • Feb
    • P. Engelke, I. Polian, M. Renovell, and B. Becker, "Automatic test pattern generation for resistive bridging faults," J. Electron. Test.: Theory Appl., vol. 22, no. 1, pp. 61-69, Feb. 2006.
    • (2006) J. Electron. Test.: Theory Appl , vol.22 , Issue.1 , pp. 61-69
    • Engelke, P.1    Polian, I.2    Renovell, M.3    Becker, B.4
  • 14
    • 0035699094 scopus 로고    scopus 로고
    • Faulty resistance sectioning technique for resistive bridging fault ATPG systems
    • Kyoto, Japan, Nov
    • T. Shinogi, T. Kanbayashi, T. Yoshikawa, S. Tsuruoka, and T. Hayashi, "Faulty resistance sectioning technique for resistive bridging fault ATPG systems," in Proc. ATS, Kyoto, Japan, Nov. 2001, pp. 76-81.
    • (2001) Proc. ATS , pp. 76-81
    • Shinogi, T.1    Kanbayashi, T.2    Yoshikawa, T.3    Tsuruoka, S.4    Hayashi, T.5
  • 16
    • 0031364277 scopus 로고    scopus 로고
    • Pseudo-random, pattern testing of bridging faults
    • Oct
    • N. A. Touba and E. J. McCluskey, "Pseudo-random, pattern testing of bridging faults," in Proc. IEEEICCD, Oct. 1997, pp. 54-60.
    • (1997) Proc. IEEEICCD , pp. 54-60
    • Touba, N.A.1    McCluskey, E.J.2
  • 18
    • 0029718599 scopus 로고    scopus 로고
    • Test point insertion based on path, tracing
    • Apr
    • N. A. Touba and E. J. McCluskey, "Test point insertion based on path, tracing," in Proc. IEEE VTS, Apr. 1996, pp. 2-8.
    • (1996) Proc. IEEE VTS , pp. 2-8
    • Touba, N.A.1    McCluskey, E.J.2
  • 19
    • 44149096861 scopus 로고    scopus 로고
    • Nov. 2007, Online, Available
    • TPI: Experimental Data, Nov. 2007. [Online]. Available: http://users.ecs.soton.ac.uk/ssk06r/data/TPI.tgz
    • TPI: Experimental Data


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.