Detection of defects using fault model oriented test sequences

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 14, Issue 1, 1999, Pages 13-22

  Renovell, Michel ^a   Azaïs, Florence ^a   Bertrand, Yves ^a  

^a LIRMM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; MATHEMATICAL MODELS;

ANALOG DETECTABILITY INTERVAL (ADI); FAULT MODEL ORIENTED TEST SEQUENCES;

INTEGRATED CIRCUIT TESTING;

EID: 0032635467     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1008336919671     Document Type: Article

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