Resistive bridge fault modeling, simulation and test generation

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 596-605

  Sar Dessai, Vijay R ^a   Walker, D M H ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRIDGE CIRCUITS; ELECTRIC FAULT CURRENTS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; FUNCTIONS; PROBABILITY DISTRIBUTIONS; SET THEORY;

BRIDGING RESISTANCE; RESISTIVE BRIDGE FAULTS;

COMPUTER SIMULATION;

EID: 0033318725     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)