Charge trapping and ac-electrical conduction in nanocrystalline erbium manganate film on Si substrate

Journal of Alloys and Compounds

Volumn 458, Issue 1-2, 2008, Pages 77-82

  Dakhel, A A ^a  

^a UNIVERSITY OF BAHRAIN   (Bahrain)

Author keywords

CBH mechanism; Conduction phenomena in insulators; Dielectric phenomena; Erbium manganese oxide; Insulating films

Indexed keywords

CHARGE DENSITY; CHARGE TRAPPING; ELECTRIC CONDUCTIVITY; ERBIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION;

DIELECTRIC PHENOMENA; ERBIUM-MANGANESE OXIDE; INSULATING FILMS; X-RAY FLUORESCENCE (XRF);

NANOCRYSTALLINE MATERIALS;

EID: 42949121969     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.04.050     Document Type: Article

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