Precision calibration and systematic error reduction in the long trace profiler

Optical Engineering

Volumn 39, Issue 1, 2000, Pages 304-310

  Qian, Shinan ^a,b   Sostero, Giovanni ^a   Takacs, Peter Z ^b  

^a SINCROTRONE TRIESTE   (Italy)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ERROR ANALYSIS; FOURIER TRANSFORMS; MEASUREMENT ERRORS; OPTICAL INSTRUMENT LENSES; PHOTODETECTORS; SCANNING;

LONG TRACE PROFILERS (LTP);

MIRRORS;

EID: 0033888254     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.602364     Document Type: Article

References (22)

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