Three-dimensional electrostatic potential of a Si p-n junction revealed using tomographic electron holography

Journal of Physics: Conference Series

Volumn 26, Issue 1, 2006, Pages 29-32

  Twitchett, A C ^a   Yates, T J V ^a   Dunin Borkowski, R E ^a   Newcomb, S B ^b   Midgley, P A ^a  

^a Department of Materials Science and Metallurgy ^*  (United Kingdom)

^b NEWPORT CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33644499447     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/26/1/007     Document Type: Conference Paper

References (7)

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3. Midgley P A and Weyland M 2003 Ultramicroscopy 96 3-4 413
4. Rau W D, Schwander P, Baumann F H, Hoppner W and Ourmazd A 1999 Phys Rev Lett 82 2614
5. Crowther T A, DeRosier D J and Klug A 1970 Proc Roy Soc Lond A 317 319
6. Lichte H 1991 Ultramicroscopy 38 13
7. Somodi P K, R E Dunin-Borkowski, A C Twitchett, C H W Barnes and P A Midgley 2003 Inst Phys Conf Ser 180 501