Variability-driven formulation for simultaneous gate sizing and postsilicon tunability allocation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 27, Issue 4, 2008, Pages 610-620

  Khandelwal, Vishal ^b   Srivastava, Ankur ^a,c  

^a IEEE

^b SYNOPSYS INC   (United States)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

Convex programming; Fabrication randomness; Optimality

Indexed keywords

ALGORITHMS; MICROMETERS; STATISTICAL METHODS; STOCHASTIC PROGRAMMING;

CONVEX PROGRAMMING; FABRICATION RANDOMNESS; OPTIMALITY;

INTEGRATED CIRCUITS;

EID: 41549134131     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2008.917960     Document Type: Conference Paper

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