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Volumn , Issue , 2004, Pages 611-618

A yield improvement methodology using pre- and post-silicon statistical clock scheduling

Author keywords

[No Author keywords available]

Indexed keywords

CLOCK SCHEDULING; CLOCK SKEWS; DELAY-FAULT TESTING; STATISTICAL TIMING ANALYSIS;

EID: 16244383507     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (72)

References (27)
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    • 84986979889 scopus 로고
    • Faster parametric shortest path and minimum-balance algorithms
    • N. E. Young, Robert E. Tarjan, and J. B. Orlin. Faster parametric shortest path and minimum-balance algorithms. Networks, 21:205-221, 1991.
    • (1991) Networks , vol.21 , pp. 205-221
    • Young, N.E.1    Tarjan, R.E.2    Orlin, J.B.3
  • 12
    • 0027833796 scopus 로고
    • Delay testing for non-robust untestable circuits
    • Oct
    • Kwang-Ting Cheng and H-C. Chen. Delay testing for non-robust untestable circuits. In International Test Conference, pages 954-961, Oct 1993.
    • (1993) International Test Conference , pp. 954-961
    • Cheng, K.-T.1    Chen, H.-C.2
  • 13
    • 0026238696 scopus 로고
    • DYNAMITE: An efficient automatic test pattern generation system for path delay faults
    • Oct
    • Karl Fuchs, Franz Fink, and Michael H. Schulz. DYNAMITE: An efficient automatic test pattern generation system for path delay faults. IEEE Transactions on Computer-aided design, 10(10):1323-1335, Oct 1991.
    • (1991) IEEE Transactions on Computer-aided Design , vol.10 , Issue.10 , pp. 1323-1335
    • Fuchs, K.1    Fink, F.2    Schulz, M.H.3
  • 15
    • 0036049286 scopus 로고    scopus 로고
    • False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation
    • Jing-Jia Liou, Angela Krstic, Li-C. Wang, and Kwang-Ting Cheng. False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation. In Proceedings of the 39th conference on Design automation, pages 566-569, 2002.
    • (2002) Proceedings of the 39th Conference on Design Automation , pp. 566-569
    • Liou, J.-J.1    Krstic, A.2    Wang, L.-C.3    Cheng, K.-T.4
  • 21
    • 0034317347 scopus 로고    scopus 로고
    • Clock generation and distribution for the first IA-64 microprocessor
    • Nov
    • Simon Tam, Stefan Rusu, Utpal Nagarji Desai, Robert Kim, Ji Zhang, and Ian Young. Clock generation and distribution for the first IA-64 microprocessor. IEEE Journal of Solid-State Circuits, 35(11):1545-1552, Nov 2000.
    • (2000) IEEE Journal of Solid-State Circuits , vol.35 , Issue.11 , pp. 1545-1552
    • Tam, S.1    Rusu, S.2    Desai, U.N.3    Kim, R.4    Zhang, J.5    Young, I.6
  • 24
    • 0028734911 scopus 로고
    • RESIST: A recursive test pattern generation algorithm for path delay faults considering various test classes
    • Dec
    • K. Fuchs, M. Pabst, and T. Rossel. RESIST: A recursive test pattern generation algorithm for path delay faults considering various test classes. IEEE Transactions on Computer-aided design, 13(12):1550-1562, Dec 1994.
    • (1994) IEEE Transactions on Computer-aided Design , vol.13 , Issue.12 , pp. 1550-1562
    • Fuchs, K.1    Pabst, M.2    Rossel, T.3
  • 26
    • 0029318778 scopus 로고
    • An advanced diagnostic method for delay faults in combinational faulty circuits
    • P. Girard, C. Landrault, and S. Pravossoudovitch. An advanced diagnostic method for delay faults in combinational faulty circuits. J. Electron. Testing, 6(3):277-293, 1995.
    • (1995) J. Electron. Testing , vol.6 , Issue.3 , pp. 277-293
    • Girard, P.1    Landrault, C.2    Pravossoudovitch, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.