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Volumn 56, Issue 7, 2008, Pages 1633-1641

A simple nanoindentation-based methodology to assess the strength of brittle thin films

Author keywords

Fracture; Nanoindentation; Thin films

Indexed keywords

AMORPHOUS CARBON; BRITTLE FRACTURE; COMPOSITE FILMS; DEPOSITION; FOCUSED ION BEAMS; NANOCOMPOSITES; NANOINDENTATION;

EID: 40849086150     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2007.12.007     Document Type: Article
Times cited : (25)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.