SCOPUS 정보 검색 플랫폼

Volumn 198, Issue 1-3 SPEC. ISS., 2005, Pages 165-168

The application of focused ion beam technology to the characterization of coatings

Author keywords

Coatings; Electron microscopy; Focused ion beam

Indexed keywords

COATINGS; ELECTRON MICROSCOPY; MICROSTRUCTURE; WEAR RESISTANCE;

FOCUSSED ION BEAM (FIB) TECHNOLOGY; MICROSTRUCTURAL CHARACTERIZATION; WEAR TESTING;

ION BEAMS;

COATING; WEAR RESISTANCE;

EID: 20744444883 PISSN: 02578972 EISSN: None Source Type: Journal
DOI: 10.1016/j.surfcoat.2004.10.042 Document Type: Article

Times cited : (51)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.