Effects of individual layer thickness on the microstructure and optoelectronic properties of sol-gel-derived zinc oxide thin films

Journal of the American Ceramic Society

Volumn 91, Issue 3, 2008, Pages 846-851

  Bel Hadj Tahar, Noureddine ^a   Bel Hadj Tahar, Radhouane ^b   Ben Salah, Abdelhamid ^b   Savall, André ^c  

^a FACULTÉ DES SCIENCES DE MONASTIR   (Tunisia)

^b UNIVERSITY OF SFAX   (Tunisia)

^c UNIVERSITÉ PAUL SABATIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; FILM THICKNESS; MICROSTRUCTURAL EVOLUTION; OPTOELECTRONIC DEVICES; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; THICKNESS CONTROL; ZINC OXIDE;

COLUMNAR GROWTH; CRYSTALLINITY; GRAIN COLUMNS; OPTIMAL CONDITIONS;

THIN FILMS;

EID: 40449113504     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2007.02221.x     Document Type: Conference Paper

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