Microstructure of TiO2 and ZnO films fabricated by the sol-gel method

Journal of the American Ceramic Society

Volumn 79, Issue 4, 1996, Pages 825-830

  Ohya, Yutaka ^a,b   Saiki, Hisao ^a   Tanaka, Toshimasa ^a   Takahashi, Yasutaka ^a  

^a GIFU UNIVERSITY   (Japan)

^b AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COATING TECHNIQUES; CRYSTAL MICROSTRUCTURE; DIFFUSION; ELECTRIC CONDUCTIVITY; GRAIN GROWTH; REFRACTIVE INDEX; SOL-GELS; SPECTROMETERS; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

CRYSTALLINE PHASES; DIP COATING; SPIN-ON COATING;

FILMS;

EID: 0030128764     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb08512.x     Document Type: Article

References (21)

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