SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Applied Physics Letters

Volumn 77, Issue 3, 2000, Pages 349-351

Structural evolution of ZnO/sapphire(001) heteroepitaxy studied by real time synchrotron x-ray scattering

(5) Park, Sang Il a,b Cho, Tae Sik a,c Doh, Seok Joo a Lee, Jong Lam a Je, Jung Ho a

a Pohang University of Science and Technology (POSTECH) (South Korea)

b R and D Center (South Korea)

c Kyungpook National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010522057 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.126972 Document Type: Article

Times cited : (55)

References (18)

1
- 0142109458
- Z. K. Tang, G. K. L. Wong, P. Yu, M. Kawasaki, A. Ohtomo, H. Koinuma, and Y. Segawa, Appl. Phys. Lett. 72, 3270 (1998).
- (1998) Appl. Phys. Lett. , vol.72 , pp. 3270
- Tang, Z.K.¹ Wong, G.K.L.² Yu, P.³ Kawasaki, M.⁴ Ohtomo, A.⁵ Koinuma, H.⁶ Segawa, Y.⁷

2
- 1542713832
- D. M. Bagnall, Y. F. Chen, X. Zhu, T. Yao, M. Y. Shen, and T. Goto, Appl. Phys. Lett. 73, 1038 (1998).
- (1998) Appl. Phys. Lett. , vol.73 , pp. 1038
- Bagnall, D.M.¹ Chen, Y.F.² Zhu, X.³ Yao, T.⁴ Shen, M.Y.⁵ Goto, T.⁶

3
- 0030913555
- R. F. Service, Science 276, 895 (1997).
- (1997) Science , vol.276 , pp. 895
- Service, R.F.¹

4
- 36449007977
- A. Hachigo, H. Nakahata, K. Higaki, S. Fujii, and S.-I. Shikata, Appl. Phys. Lett. 65, 2556 (1994).
- (1994) Appl. Phys. Lett. , vol.65 , pp. 2556
- Hachigo, A.¹ Nakahata, H.² Higaki, K.³ Fujii, S.⁴ Shikata, S.-I.⁵

5
- 0000240217
- B. Wacogne, M. P. Roe, T. J. Pattinson, and C. N. Pannell, Appl. Phys. Lett. 67, 1674 (1995).
- (1995) Appl. Phys. Lett. , vol.67 , pp. 1674
- Wacogne, B.¹ Roe, M.P.² Pattinson, T.J.³ Pannell, C.N.⁴

6
- 2542422532
- D. M. Bagnall, Y. F. Chen, Z. Zhu, T. Yao, S. Koyama, M. Y. Shen, and T. Goto, Appl. Phys. Lett. 70, 2230 (1997).
- (1997) Appl. Phys. Lett. , vol.70 , pp. 2230
- Bagnall, D.M.¹ Chen, Y.F.² Zhu, Z.³ Yao, T.⁴ Koyama, S.⁵ Shen, M.Y.⁶ Goto, T.⁷

7
- 0000288835
- Y. Chen, D. M. Bagnall, H.-J. Koh, K.-T. Park, K. Hiraga, Z. Zhu, and T. Yao, J. Appl. Phys. 84, 3912 (1998).
- (1998) J. Appl. Phys. , vol.84 , pp. 3912
- Chen, Y.¹ Bagnall, D.M.² Koh, H.-J.³ Park, K.-T.⁴ Hiraga, K.⁵ Zhu, Z.⁶ Yao, T.⁷

8
- 0000297734
- R. D. Vispute, V. Talyansky, Z. Trajanovic, S. Choopun, M. Downes, R. P. Sharma, T. Venkatesan, M. C. Woods, R. T. Lareau, K. A. Jones, and A. A. Iliadis, Appl. Phys. Lett. 70, 2735 (1997).
- (1997) Appl. Phys. Lett. , vol.70 , pp. 2735
- Vispute, R.D.¹ Talyansky, V.² Trajanovic, Z.³ Choopun, S.⁴ Downes, M.⁵ Sharma, R.P.⁶ Venkatesan, T.⁷ Woods, M.C.⁸ Lareau, R.T.⁹ Jones, K.A.¹⁰ Iliadis, A.A.¹¹

9
- 0001184799
- J. Narayan, K. Dovidenko, A. K. Sharma, and S. Oktyabrsky, J. Appl. Phys. 84, 2597 (1998).
- (1998) J. Appl. Phys. , vol.84 , pp. 2597
- Narayan, J.¹ Dovidenko, K.² Sharma, A.K.³ Oktyabrsky, S.⁴

10
- 0000238112
- D. Y. Noh, Y. Hwu, H. K. Kim, and M. Hong, Phys. Rev. B 51, 4441 (1995).
- (1995) Phys. Rev. B , vol.51 , pp. 4441
- Noh, D.Y.¹ Hwu, Y.² Kim, H.K.³ Hong, M.⁴

11
- 0031147325
- J. H. Je, D. Y. Noh, H. K. Kim, and K. S. Liang, J. Appl. Phys. 81, 6126 (1997).
- (1997) J. Appl. Phys. , vol.81 , pp. 6126
- Je, J.H.¹ Noh, D.Y.² Kim, H.K.³ Liang, K.S.⁴

12
- 0032621681
- T. S. Cho, S. J. Doh, J. H. Je, and D. Y. Noh, J. Appl. Phys. 86, 1958 (1999).
- (1999) J. Appl. Phys. , vol.86 , pp. 1958
- Cho, T.S.¹ Doh, S.J.² Je, J.H.³ Noh, D.Y.⁴

13
- 0012768260
- D. J. Eaglesham, J. E. Bower, M. A. Marcus, M. Gross, and S. Merchant, Appl. Phys. Lett. 71, 219 (1997).
- (1997) Appl. Phys. Lett. , vol.71 , pp. 219
- Eaglesham, D.J.¹ Bower, J.E.² Marcus, M.A.³ Gross, M.⁴ Merchant, S.⁵

14
- 0005767048
- S. J. Doh, S. I. Park, T. S. Cho, and J. H. Je, J. Vac. Sci. Technol. A 17, 3003 (1999).
- (1999) J. Vac. Sci. Technol. A , vol.17 , pp. 3003
- Doh, S.J.¹ Park, S.I.² Cho, T.S.³ Je, J.H.⁴

15
- 0004108666
- Taylor & Francis, London, Chap. 6
- D. K. Bowen and B. K. Tanner, High resolution x-ray diffractometry and Topography (Taylor & Francis, London, 1998), Chap. 6.
- (1998) High Resolution X-ray Diffractometry and Topography
- Bowen, D.K.¹ Tanner, B.K.²

16
- 0042553298
- Pergamon, New York, Chap. 7
- M. B. Bever. Encyclopedia of Materials Science and Engineering (Pergamon, New York, 1986), Chap. 7, p. 5529.
- (1986) Encyclopedia of Materials Science and Engineering , pp. 5529
- Bever, M.B.¹

17
- 0000946068
- P. F. Miceli and C. J. Palmstrom, Phys. Rev. B 51, 5506 (1995).
- (1995) Phys. Rev. B , vol.51 , pp. 5506
- Miceli, P.F.¹ Palmstrom, C.J.²

18
- 0003472812
- Dover, New York, Chap. 13
- B. E. Warren, X-ray Diffraction (Dover, New York, 1990), Chap. 13.
- (1990) X-ray Diffraction
- Warren, B.E.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.