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Volumn 92, Issue 6, 2008, Pages

Two-dimensional electrostatic force field measurements with simultaneous topography measurement on embedded interdigitated nanoelectrodes using a force distance curve based method

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; PLATINUM; TOPOGRAPHY;

EID: 39349099748     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2844882     Document Type: Article
Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.