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Volumn 26, Issue 3, 2007, Pages 396-401

Force volume imaging of defects in highly drawn high-density polyethylene

Author keywords

AFM; Defect; Drawn polyethylene; Morphology

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; DEFECTS; IMAGING TECHNIQUES; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY;

EID: 34047143127     PISSN: 01429418     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymertesting.2006.12.009     Document Type: Article
Times cited : (7)

References (18)
  • 12
    • 34047181294 scopus 로고    scopus 로고
    • note
    • Multimode™ SPM Instruction Manual, Version 4.31ce, Digital Instruments Veeco Metrology Group
  • 14
    • 34047109953 scopus 로고    scopus 로고
    • note
    • Multimode™ SPM Instruction Manual, Version 4.31ce, Digital Instruments Veeco Metrology Group, pp. 11-7
  • 16
    • 34047175103 scopus 로고    scopus 로고
    • note
    • Multimode™ SPM Instruction Manual, Version 4.31ce, Digital Instruments Veeco Metrology Group, pp. 11-13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.