Nanoscale probing of electrode surfaces by scanning force microscopy

Chimia

Volumn 60, Issue 11, 2006, Pages 789-794

  Fermín, David J ^a  

^a UNIVERSITY OF BERN   (Switzerland)

Author keywords

Double layer forces; Electrochemistry; Modified electrodes; Scanning electrochemical microscopy

Indexed keywords

EID: 33845643569     PISSN: 00094293     EISSN: None     Source Type: Journal    
DOI: 10.2533/chimia.2006.789     Document Type: Article

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